Dr. Vidya Venkatachalam
Vision System Research Eng at Micro Encoder Inc
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 22 May 2003
Proc. SPIE. 5011, Machine Vision Applications in Industrial Inspection XI
KEYWORDS: Signal to noise ratio, Imaging systems, Cameras, Image resolution, Digital cameras, Image quality, Quantization, Light sources and illumination, Spatial resolution, Analog electronics

Proceedings Article | 22 May 2003
Proc. SPIE. 5011, Machine Vision Applications in Industrial Inspection XI
KEYWORDS: Signal to noise ratio, Point spread functions, Edge detection, Visual process modeling, Detection and tracking algorithms, Data modeling, Image processing, Image resolution, Computer simulations, Reconstruction algorithms

Proceedings Article | 4 December 2000
Proc. SPIE. 4119, Wavelet Applications in Signal and Image Processing VIII
KEYWORDS: Wavelet transforms, Principal component analysis, Image segmentation, Matrices, Pattern recognition, Wavelets, Projection systems, Image classification, Algorithm development, Time-frequency analysis

Proceedings Article | 24 August 2000
Proc. SPIE. 4053, Algorithms for Synthetic Aperture Radar Imagery VII
KEYWORDS: Image processing algorithms and systems, Roads, Detection and tracking algorithms, Data modeling, Synthetic aperture radar, Image segmentation, Image processing, Wavelets, Receivers, Computer programming

Proceedings Article | 24 August 2000
Proc. SPIE. 4053, Algorithms for Synthetic Aperture Radar Imagery VII
KEYWORDS: Image processing algorithms and systems, Image fusion, Wavelet transforms, Data modeling, Speckle, Synthetic aperture radar, Image segmentation, Image processing, Wavelets, Expectation maximization algorithms

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