Mr. Viktor Dubec
at Technische Univ Wien
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | June 29, 2004
Proc. SPIE. 5290, Practical Holography XVIII: Materials and Applications
KEYWORDS: Semiconductors, Optical filters, Holography, Metals, Error analysis, Silicon, Reflectivity, Interferometry, Image filtering, Phase shifts

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