We have produced aluminum wire grids with 33 nm periodicity using a thin film of a self-assembling cylinder
forming diblock copolymer as a template. These grids, supported on fused quartz wafers, function as transmission
polarizers for visible and near-ultraviolet lights and are a thin design, compared to commercially available polarization
prisms. Their polarization efficiency is measured to be near 50% in the visible. Quantitative comparison with a new
theoretical analysis of such wire grids indicates that they should perform well into the far UV. This analysis also
explains a reversal in polarization direction at short wavelengths which we observe in our specimens. This is an
expanded version of a previous paper.1
Spectroscopic ellipsometry is commonly used for the optical characterization of solid state thin films and bulk substrates. In recent years, it has also gained widespread use in characterizing organic films . The discovery of carbon nano-tubes has increased the utility of organic films by allowing the engineer to alter the electrical and mechanical properties of the material by doping the film with these graphite structures. Proper understanding through PMSE characterization of the structure is necessary to control desired optical and electrical properties. In this work we present mothodes of PMSE as an advantageous, non-destructive optical tool for the study of C70 doped PS-PHMA thin film on a c-Si(100) wafer. For the samples measured, concentration of C70 is reported along with dispersion relations for PS-PHMA films in the UV-Vis spectrum for untreated, heated and shear aligned films. There is also evidence that the C70 may also align within the micro-domain of the PS-PHMA producing an anisotropic film.