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Dr. Virgil B. Elings
Retired at Solvang Vintage Motorcycle Museum
SPIE Involvement:
Author
Publications (4)
Proceedings Article | 15 April 1997 Paper
Atomic force microscopy using small cantilevers
Deron Walters, Mario Viani, George Paloczi, Tilman Schaeffer, Jason Cleveland, Mark Wendman, Gus Gurley, Virgil Elings, Paul Hansma
Proceedings Volume 3009, (1997) https://doi.org/10.1117/12.271227
KEYWORDS: Atomic force microscopy, Proteins, Crystals, Calcite, Distortion, Image processing, Electronics, Image resolution, Feedback loops, Feedback signals
Proceedings Article | 15 April 1997 Paper
Bent-fiber near-field scanning optical microscopy probes for use with commercial atomic force microscopes
Roderick Taylor, Kurt Leopold, Mark Wendman, Gus Gurley, Virgil Elings
Proceedings Volume 3009, (1997) https://doi.org/10.1117/12.271220
KEYWORDS: Waveguides, Near field scanning optical microscopy, Silicon, Near field, Near field optics, Optical fibers, Atomic force microscopy, Microfabrication, Light scattering, Stray light
Proceedings Article | 1 May 1992 Paper
Three-dimensional surface profile of Fe-based metallic thin films
Proceedings Volume 1639, (1992) https://doi.org/10.1117/12.58174
KEYWORDS: Annealing, Surface roughness, Thin films, Magnetism, Crystals, Transformers, Diffraction, Chromium, Scanning tunneling microscopy, Scanning probe microscopy
Proceedings Article | 1 August 1990 Paper
Measuring surface roughness of an optical thin film with scanning tunneling microscopes
Proceedings Volume 1270, (1990) https://doi.org/10.1117/12.20373
KEYWORDS: Scanning tunneling microscopy, Thin films, Surface roughness, Mirrors, 3D image processing, Crystals, Glasses, X-ray diffraction, Scientific research, Metals
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