Ms. Virpi Korpelainen
at MIKES Mittatekniikan keskus
SPIE Involvement:
Author
Publications (4)

SPIE Journal Paper | February 28, 2012
JM3 Vol. 11 Issue 1
KEYWORDS: Calibration, Error analysis, Metrology, Atomic force microscopy, Interferometers, Atomic force microscope, Interferometry, Time metrology, Standards development, Statistical analysis

PROCEEDINGS ARTICLE | June 1, 2011
Proc. SPIE. 8036, Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences
KEYWORDS: Refractive index, Metrology, Interferometers, Calibration, Scanners, Error analysis, Interferometry, Atomic force microscopy, Time metrology, Standards development

SPIE Journal Paper | October 1, 2004
OE Vol. 43 Issue 10
KEYWORDS: Temperature metrology, Refractive index, Acoustics, Humidity, Ultrasonography, Distance measurement, Interferometry, Interferometers, Protactinium, Sensors

PROCEEDINGS ARTICLE | November 20, 2003
Proc. SPIE. 5190, Recent Developments in Traceable Dimensional Measurements II
KEYWORDS: Refractive index, Interferometers, Ultrasonography, Interferometry, Time metrology, Humidity, Transducers, Distance measurement, Acoustics, Temperature metrology

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