Dr. Vojtěch Vozda
at Charles Univ
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 9 September 2019 Paper
Proc. SPIE. 11109, Advances in Metrology for X-Ray and EUV Optics VIII
KEYWORDS: Mirrors, X-rays, Free electron lasers, Sensors, Computer programming, Diffraction gratings, Scattering, Spectroscopes, Metrology

Proceedings Article | 14 May 2019 Presentation
Proc. SPIE. 11035, Optics Damage and Materials Processing by EUV/X-ray Radiation VII
KEYWORDS: Graphene, Silicon carbide, Atomic force microscopy, Scanning electron microscopy, Fabrication, Crystals, Phonons, Zinc, Extreme ultraviolet, Laser systems engineering

Proceedings Article | 14 May 2019 Presentation
Proc. SPIE. 11035, Optics Damage and Materials Processing by EUV/X-ray Radiation VII
KEYWORDS: X-rays, Optical filters, X-ray lasers, Free electron lasers, Laser ablation, Aluminum, Silicon, Signal attenuation, Extreme ultraviolet, Metals

Proceedings Article | 14 May 2019 Presentation
Proc. SPIE. 11035, Optics Damage and Materials Processing by EUV/X-ray Radiation VII
KEYWORDS: X-ray characterization, X-ray lasers, X-rays, Free electron lasers, Extreme ultraviolet, Laser development, Laser ablation, Statistical analysis, Liquid crystal lasers, Light sources

Proceedings Article | 21 June 2017 Presentation
Proc. SPIE. 10236, Damage to VUV, EUV, and X-ray Optics VI
KEYWORDS: Physics, Stanford Linear Collider, Free electron lasers, Lead, Photons, States of matter, Materials processing, Electrons, Analytical research, Raman spectroscopy

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