In this paper, we have investigated some structural properties, Raman spectra of Zn<sub>1-x</sub>Mn<sub>x</sub>T<sub>e</sub> films deposited by the closed space vacuum sublimation under different growth conditions. The obtained results of the Raman spectroscopy and XRD analysis show single phase composition of the samples. The presence of phonon replicas in the Raman spectra of the films indicates their high structural quality. The manganese content (about 7 %) in the layers was determined
according to shifting the relative peaks positions.
In work the complex investigation of structural and optical properties of CdTe and Cd1-xMnxTe semiconductor films
deposited by close-spaced vacuum sublimation method using thermal evaporation on non-oriented substrates was carried
out. The structural and phase analysis of the layers condensed at different substrate temperatures was performed.