Woong Jae Chung
at GLOBALFOUNDRIES Inc
SPIE Involvement:
Author
Publications (12)

Proceedings Article | 20 March 2018
Proc. SPIE. 10587, Optical Microlithography XXXI
KEYWORDS: Reticles, Metrology, Scanners, Extreme ultraviolet, High volume manufacturing, Optical alignment, Optimization (mathematics), Semiconducting wafers, HVAC controls, Overlay metrology

Proceedings Article | 24 March 2017
Proc. SPIE. 10147, Optical Microlithography XXX
KEYWORDS: Near infrared, Sensors, Scanners, Aluminum, Optical alignment, Laser beam diagnostics

Proceedings Article | 24 March 2017
Proc. SPIE. 10147, Optical Microlithography XXX
KEYWORDS: Lithium, Roads, Data modeling, Scanners, Optical alignment, Yield improvement, Overlay metrology

Proceedings Article | 21 April 2016
Proc. SPIE. 9778, Metrology, Inspection, and Process Control for Microlithography XXX
KEYWORDS: Reticles, Metrology, Data modeling, Deep ultraviolet, Metals, Scanners, Process control, Photomasks, Image enhancement, Semiconducting wafers, Overlay metrology

Proceedings Article | 18 March 2016
Proc. SPIE. 9778, Metrology, Inspection, and Process Control for Microlithography XXX
KEYWORDS: Mathematical modeling, Metrology, Data modeling, Scanners, Process control, High volume manufacturing, Semiconducting wafers, Overlay metrology

Showing 5 of 12 publications
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