Wade A. Berzett
at Georgia Institution of Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 19 August 2005
Proc. SPIE. 5870, Advances in Thin-Film Coatings for Optical Applications II
KEYWORDS: Thin films, Refractive index, Polarization, Signal attenuation, Interfaces, Computing systems, Polarizers, Thin film coatings, Tolerancing, Thin film devices

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