Dr. Wafik H. Iskander
at West Virginia Univ
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | March 4, 2004
Proc. SPIE. 5263, Intelligent Manufacturing
KEYWORDS: Data modeling, Error analysis, Control systems, Signal processing, Smoothing, Neural networks, Statistical modeling, Systems modeling, Fuzzy logic, Fuzzy systems

PROCEEDINGS ARTICLE | March 4, 2004
Proc. SPIE. 5263, Intelligent Manufacturing
KEYWORDS: Statistical analysis, Error analysis, Computing systems, Control systems, Motion detection, Light sources and illumination, Information security, Computer security, Electrical breakdown, Focus stacking software

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