Mr. Walan C. Grizolli
Postdoc at Argonne National Lab
SPIE Involvement:
Author
Area of Expertise:
X-ray optics , Ray tracing simulations , Instrumentation for synchrotron radiation beamlines , Wavefront propagation
Publications (2)

PROCEEDINGS ARTICLE | September 7, 2017
Proc. SPIE. 10385, Advances in Metrology for X-Ray and EUV Optics VII
KEYWORDS: Metrology, X-rays, Wavefront sensors, Interferometry, Wavefronts, X-ray imaging, Interferometers, Near field, Speckle, Phase contrast

PROCEEDINGS ARTICLE | September 5, 2014
Proc. SPIE. 9209, Advances in Computational Methods for X-Ray Optics III
KEYWORDS: Mirrors, Optical components, Surface finishing, Light wave propagation, Diffraction, Fourier optics, Surface plasmons, Phase shifts, Polishing, Human-machine interfaces

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