Wan Di
at Harbin Engineering Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 28 November 2007
Proc. SPIE. 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
KEYWORDS: Digital signal processing, Modulation, Interferometers, Linear filtering, Demodulation, Vibrometry, Signal processing, Analog electronics, Signal detection, Filtering (signal processing)

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