Dr. Wanchuck Woo
at Oak Ridge National Lab
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 22 April 2009
Proc. SPIE. 7299, Thermosense XXXI
KEYWORDS: Inspection, Thermography, Radiation thermography, Infrared imaging, Resistance, Temperature metrology, Nondestructive evaluation, Thermal modeling, Infrared cameras, Finite element methods

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