Based on the current array CCD image sensor technology, integration time of each pixel sensitive unit in the CCD image
sensor was controlled independently by way of adding circuits for pixel sensitive unit addressing and integration pulse
generating. The integration time of the pixel sensitive unit was shortened appropriately when charges overflowed
potential well of pixel sensitive unit in the array CCD Image Sensor, thereby achieving the aim of anti-blooming. The
method was simulated by MATLAB and can obtain an ideal effect.