Wang Siyu
at Fine Optical Engineering Research Centre
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 28 October 2016
Proc. SPIE. 9683, 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
KEYWORDS: Thin films, Optical properties, Surface roughness, Atomic force microscopy, Oxygen, Transmittance, Gadolinium, Thin film deposition, Absorption, Oxidation

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