Wang Wei
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 16 August 2013
Proc. SPIE. 8912, International Symposium on Photoelectronic Detection and Imaging 2013: Low-Light-Level Technology and Applications
KEYWORDS: Diffraction, Beam splitters, Fringe analysis, Optical lithography, Interferometers, Interferometry, Wavefronts, Optical testing, Computer generated holography, Spherical lenses

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