Dr. Wayne A. Keen
Target Signature Analyst at US Air Force
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 24 April 2010
Proc. SPIE. 7663, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XV
KEYWORDS: Logic, Clocks, Visualization, Graphics processing units, Computer programming, Computer simulations, Data processing, Software development, Computer architecture

Proceedings Article | 24 April 2010
Proc. SPIE. 7663, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XV
KEYWORDS: Optical components, Coastal modeling, Data modeling, Visualization, Reflection, Water, Capillaries, Particles, Ocean optics, Motion models

Proceedings Article | 12 September 2003
Proc. SPIE. 5092, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VIII
KEYWORDS: Mid-IR, Cameras, Sensors, Image processing, Error analysis, Distortion, Projection systems, Infrared radiation, Optical alignment, Temperature metrology

Proceedings Article | 12 July 2002
Proc. SPIE. 4717, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VII
KEYWORDS: Infrared cameras, Signal to noise ratio, Infrared imaging, Optical components, Visualization, Cameras, Electroluminescence, Projection systems, Infrared radiation, Chemical elements

Proceedings Article | 31 August 2001
Proc. SPIE. 4366, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing VI
KEYWORDS: Infrared cameras, Infrared imaging, Cameras, Calibration, Collimators, Projection systems, Infrared radiation, Analytical research, Projection devices, Device simulation

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