Dr. Wayne Vernon Profile

Dr. Wayne Vernon

at Area Detector Systems Corp

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Proceedings Article | 21 September 2007 Paper

First results from the 128x128 pixel mixed-mode Si x-ray detector chip

W. Vernon, M. Allin, R. Hamlin, T. Hontz, D. Nguyen, F. Augustine, S. Gruner, Ng. Xuong, D. Schuette, M. Tate, L. Koerner

Proceedings Volume 6706, 67060U (2007) https://doi.org/10.1117/12.738663

KEYWORDS: Sensors, Analog electronics, X-rays, Prototyping, X-ray detectors, Diodes, Crystals, Electronics, Diffraction, Data acquisition

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A Mixed-Mode Pixel Array Detector has been developed to measure protein crystallographic diffraction patterns. X-rays are stopped in a 500 μm thick layer of silicon diodes, and collected charge is processed by an attached ASIC. Goals of the project are high flux (10⁸ x-rays/s/pixel) capability and fast readout (< 0.5 ms dead time between frames). "Mixed-Mode" refers to a readout method whereby integrated signal accumulating in each pixel is compared against a threshold value. When the threshold is reached, a digital count is added to an 18-bit in-pixel counter and a set quantity of charge is removed from integrator. At the end of the x-ray exposure, analog signal left in the integrator is separately processed. Thus, one obtains mixed digital and analog data where the counter bits are a high order word and the analog residual provides higher precision. Typically, each count is equivalent to 100 10 keV x-rays, for a well-depth >10⁷ 10 keV x-rays/ pixel. The analog residual is digitized to 9-bit precision allowing measurement of the residual charge to better than a quarter of the charge from single 10 keV x-rays. Measurements are presented on x-ray tests at the Cornell High Energy Synchrotron Source (CHESS). Dynamic range, linearity, point-spread function and noise properties are shown. Status will be is reported on five different approaches for ASIC-diode hybridization. Progress toward bonding of a 128 x 512 pixel device is also presented.

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