Mr. Wayne D. Williams Profile

Wayne D. Williams

Physicist at Leidos Inc

SPIE Involvement:

Author

Publications (7)

Proceedings Article | 17 May 2006 Paper

Model-based multisource fusion for exploitation, classification, and recognition

Wayne Williams, Eric Keydel, Sean McCarty

Proceedings Volume 6235, 62350X (2006) https://doi.org/10.1117/12.665309

KEYWORDS: Sensors, 3D modeling, Model-based design, Scattering, Data modeling, Electro optical modeling, Solid modeling, Reflectors, Target recognition, Image fusion

Read Abstract +

Proceedings Article | 8 May 2006 Paper

Synthetic aperture radar simulation for image sensitivity assessment

Sean McCarty, Wayne Williams, Eric Keydel

Proceedings Volume 6210, 621001 (2006) https://doi.org/10.1117/12.666559

KEYWORDS: Synthetic aperture radar, Sensors, 3D modeling, Scattering, Image sensors, Video, Solid modeling, Signal processing, Image acquisition, Image quality

Read Abstract +

Proceedings Article | 13 August 1999 Paper

Reasoning support and uncertainty prediction in model-based vision SAR ATR

Eric Keydel, Wayne Williams, Russell Sieron, Vasik Rajlich, Stephen Stanhope

Proceedings Volume 3721, (1999) https://doi.org/10.1117/12.357677

KEYWORDS: Solid modeling, Scattering, Computer aided design, Synthetic aperture radar, Feature extraction, 3D modeling, Automatic target recognition, Sensors, Visual process modeling, Target recognition

Read Abstract +

Proceedings Article | 13 August 1999 Paper

Statistical modeling of complex target radar cross-section with the beta probability density function

Stephen Stanhope, Eric Keydel, Wayne Williams, Russell Sieron, Vasik Rajlich

Proceedings Volume 3721, (1999) https://doi.org/10.1117/12.357678

KEYWORDS: Statistical analysis, Model-based design, Automatic target recognition, Target recognition, Synthetic aperture radar, Scattering, Radar, Stochastic processes, Mathematical modeling, Target acquisition

Read Abstract +

Proceedings Article | 13 August 1999 Paper

Development of class models for model-based automatic target recognition

Wayne Williams, Justin Wojdacki, Eric Keydel, J. Richard Freeling, Andrew Morgan, Russell Sieron, Stephen Stanhope, Vasik Rajlich

Proceedings Volume 3721, (1999) https://doi.org/10.1117/12.357680

KEYWORDS: Solid modeling, Model-based design, Automatic target recognition, Computer aided design, Data modeling, Performance modeling, Target recognition, Visual process modeling, Synthetic aperture radar, Systems modeling

Read Abstract +

Proceedings Article | 15 September 1998 Paper

Use of the mean-square-error matching metric in a model-based automatic target recognition system

Stephen Stanhope, Eric Keydel, Wayne Williams, Vasik Rajlich, Russell Sieron

Proceedings Volume 3370, (1998) https://doi.org/10.1117/12.321840

KEYWORDS: Model-based design, Automatic target recognition, Scintillation, Solid modeling, Scattering, Detection and tracking algorithms, Data modeling, Synthetic aperture radar, Computer aided design, Target recognition

Read Abstract +

Proceedings Article | 13 August 1993 Paper

SOSIS: infrared ocean simulation package with target interactions

Jon Harris, Wayne Williams

Proceedings Volume 1967, (1993) https://doi.org/10.1117/12.151045

KEYWORDS: Infrared imaging, Thermal modeling, Thermography, Scattering, Infrared signatures, Polarization, Infrared radiation, Ray tracing, Reflection, Automatic target recognition

Read Abstract +

Showing 5 of 7 publications

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Keywords/Phrases

Search In:

Publication Years