Wei Cheng Wang
Engineer in System Integration at Industrial Technology Research Institute
SPIE Involvement:
Author
Publications (5)

PROCEEDINGS ARTICLE | September 21, 2011
Proc. SPIE. 8167, Optical Design and Engineering IV
KEYWORDS: Confocal microscopy, Optical design, Light sources, Switches, Sensors, Dispersion, Image processing, Inspection, Colorimetry, Image sensors

PROCEEDINGS ARTICLE | August 24, 2010
Proc. SPIE. 7767, Instrumentation, Metrology, and Standards for Nanomanufacturing IV
KEYWORDS: Confocal microscopy, Lithography, Light sources, Sensors, Spectroscopy, Inspection, Colorimetry, Image sensors, Objectives, Nanoimprint lithography

PROCEEDINGS ARTICLE | June 17, 2009
Proc. SPIE. 7389, Optical Measurement Systems for Industrial Inspection VI
KEYWORDS: Actuators, Beam splitters, Light sources, Ferroelectric materials, Interferometers, Sensors, Inspection, Optical inspection, Charge-coupled devices, Algorithm development

PROCEEDINGS ARTICLE | September 15, 2008
Proc. SPIE. 7073, Applications of Digital Image Processing XXXI
KEYWORDS: Mirrors, Beam splitters, Light sources, 3D image reconstruction, Interferometers, Inspection, 3D metrology, Profilometers, Objectives, 3D image processing

PROCEEDINGS ARTICLE | August 11, 2008
Proc. SPIE. 7063, Interferometry XIV: Techniques and Analysis
KEYWORDS: Prisms, Interferometers, Calibration, Image processing, Interferometry, 3D metrology, Profilometers, Objectives, 3D image processing, 3D microstructuring

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