Prof. Wei-Hung Su Profile

Prof. Wei-Hung Su

Associate Professor at National Sun Yat-Sen Univ

SPIE Involvement:

Conference Program Committee | Author

Publications (54)

PROCEEDINGS ARTICLE | September 4, 2018

3D image retrieval based on 1D scanning fringe projections

Proc. SPIE. 10755, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XII

KEYWORDS: Fringe analysis, Cameras, Inspection, CCD cameras, 3D metrology, Image filtering, Image retrieval, Halogens, 3D image processing, Bandpass filters

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PROCEEDINGS ARTICLE | September 4, 2018

Profile measurements for specular objects using binary-encoded patterns

Proc. SPIE. 10755, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XII

KEYWORDS: Mirrors, Fringe analysis, Calibration, Metals, Robotics, Inspection, CCD cameras, 3D metrology, Transmittance, Binary data

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PROCEEDINGS ARTICLE | September 4, 2018

One shot projected fringe profilometry using a 2D fringe-encoded pattern

Proc. SPIE. 10755, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XII

KEYWORDS: Fringe analysis, Sun, Cameras, Inspection, Reflectivity, Fourier transforms, CCD cameras, Optoelectronics, 3D metrology, Projection systems

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PROCEEDINGS ARTICLE | September 4, 2018

3D shape measurements using phase-encoded patterns and phase-shifting techniques

Proc. SPIE. 10755, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XII

KEYWORDS: Fringe analysis, Sun, Detection and tracking algorithms, Inspection, Image sensors, 3D metrology, Phase measurement, Imaging arrays, Binary data, Phase shifts

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PROCEEDINGS ARTICLE | August 23, 2017

Mathematical expressions using fringe projections for transparent objects

Proc. SPIE. 10382, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XI

KEYWORDS: Photonic devices, Refractive index, Fringe analysis, CCD cameras, Optical inspection, Ray tracing, 3D metrology, Shape analysis, 3D image processing

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PROCEEDINGS ARTICLE | August 23, 2017

A scanning approach using a binary grid pattern for 3D shape measurements

Proc. SPIE. 10382, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XI

KEYWORDS: Photonic devices, Optical sensing, 3D surface sensing, Inspection, Optical inspection, 3D metrology, Projection systems, Binary data

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PROCEEDINGS ARTICLE | August 23, 2017

One shot profile measurements using a binary-encoded pattern

Proc. SPIE. 10382, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XI

KEYWORDS: Photonic devices, Fringe analysis, Cameras, Inspection, Reflectivity, Optical inspection

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PROCEEDINGS ARTICLE | August 23, 2017

Phase-shifting projected fringe profilometry using ternary-encoded patterns

Proc. SPIE. 10382, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XI

KEYWORDS: Photonic devices, Fringe analysis, Reliability, Optical inspection, Data processing, Phase shifts

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PROCEEDINGS ARTICLE | September 7, 2016

Fabrication of holographic materials by photo-induced polymers

Proc. SPIE. 9958, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications X

KEYWORDS: Diffraction, Holograms, Holography, Polymethylmethacrylate, 3D image reconstruction, Polymers, Composites, Optical storage, Holographic materials, Diffraction gratings

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PROCEEDINGS ARTICLE | September 7, 2016

Phase unwrapping using binary-encoded fringe pattern for phase-shifting projected fringe profilometry

Proc. SPIE. 9958, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications X

KEYWORDS: Fringe analysis, Photonic crystal fibers, Inspection, Reflectivity, Computer programming, Time metrology, 3D metrology, Transmittance, Binary data, Phase shifts

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PROCEEDINGS ARTICLE | September 7, 2016

A 3D translation stage calibrated with Michelson interferometers

Proc. SPIE. 9958, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications X

KEYWORDS: Lithography, Mirrors, Beam splitters, Calibration, Fourier transforms, Interferometry, Distance measurement, 3D metrology, Phase shifts, Michelson interferometers

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PROCEEDINGS ARTICLE | September 7, 2016

Scanning fringe projection for 3D shape measurements

Proc. SPIE. 9958, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications X

KEYWORDS: Beam splitters, Light sources, Fringe analysis, Image processing, Inspection, Fourier transforms, CCD cameras, 3D metrology, 3D image processing, Bandpass filters

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PROCEEDINGS ARTICLE | September 8, 2015

Projected fringe profilometry for metal surfaces

Proc. SPIE. 9586, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications IX

KEYWORDS: Mirrors, Fringe analysis, Calibration, Metals, Inspection, Fourier transforms, CCD cameras, Image sensors, 3D metrology, Imaging arrays

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PROCEEDINGS ARTICLE | August 26, 2015

Three-dimensional shape measurements using endoscopes

Proc. SPIE. 9586, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications IX

KEYWORDS: Diffraction, Beam splitters, Fringe analysis, Holograms, Holography, Silica, Inspection, Endoscopes, CCD cameras, Volume holography

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PROCEEDINGS ARTICLE | August 26, 2015

A reliable image processing algorithm using the scanning fringe projection for 3D profile measurements

Proc. SPIE. 9586, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications IX

KEYWORDS: Beam splitters, Fringe analysis, 3D image enhancement, Cameras, Image processing, Inspection, CCD cameras, 3D metrology, Image filtering, 3D image processing

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PROCEEDINGS ARTICLE | August 26, 2015

Gray-level encoded fringe projection for profile measurements

Proc. SPIE. 9586, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications IX

KEYWORDS: Fringe analysis, Inspection, Reflectivity, Fourier transforms, Computer programming, 3D metrology, Image filtering, Transmittance, Tolerancing, Binary data

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PROCEEDINGS ARTICLE | September 5, 2014

3D shape measurements for plano-convex lenses using fringe projection techniques

Proc. SPIE. 9200, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications VIII

KEYWORDS: Refractive index, Light sources, Fringe analysis, Lenses, Inspection, Fourier transforms, CCD cameras, 3D metrology, Shape analysis, 3D image processing

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PROCEEDINGS ARTICLE | September 5, 2014

A scanning approach using fringe projection techniques for 3D profile measurements

Proc. SPIE. 9200, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications VIII

KEYWORDS: Beam splitters, Light sources, Fringe analysis, Photonic crystal fibers, Cameras, Inspection, Fourier transforms, CCD cameras, 3D metrology, 3D image processing

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PROCEEDINGS ARTICLE | September 5, 2014

Design of the binary-encoded fringe pattern for projected fringe profilometr

Proc. SPIE. 9200, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications VIII

KEYWORDS: Fabrication, Lithography, Fringe analysis, Inspection, Fourier transforms, 3D metrology, Projection systems, Transmittance, Tolerancing, Binary data

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PROCEEDINGS ARTICLE | September 5, 2014

Projected fringe profilometry for non-diffusive objects

Proc. SPIE. 9200, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications VIII

KEYWORDS: Mirrors, Fringe analysis, Holograms, Holography, Reflection, Glasses, Inspection, CCD cameras, 3D metrology, Projection devices

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PROCEEDINGS ARTICLE | September 25, 2013

Using a projected fringe pattern to identify the focused image and its application to 3D shape measurements

Proc. SPIE. 8847, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications VII

KEYWORDS: Fringe analysis, Photonic crystal fibers, 3D applications, Cameras, Sensors, Inspection, Fourier transforms, CCD cameras, 3D metrology, 3D image processing

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PROCEEDINGS ARTICLE | September 25, 2013

3D shape measurements for non-diffusive objects using fringe projection techniques

Proc. SPIE. 8847, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications VII

KEYWORDS: Mirrors, Fringe analysis, Holograms, Holography, Reflection, Glasses, Inspection, Image acquisition, CCD cameras, 3D metrology

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PROCEEDINGS ARTICLE | September 25, 2013

Design of the optical concentrator using holographic techniques for solar cells

Proc. SPIE. 8847, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications VII

KEYWORDS: Diffraction, Optical design, Holograms, Holography, Solar energy, Solar concentrators, Solar cells, Reflectivity, Spherical lenses, Lenticular lenses

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PROCEEDINGS ARTICLE | October 15, 2012

Deformation measurements using projected fringe profilometry

Proc. SPIE. 8497, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications VI

KEYWORDS: Fringe analysis, Three dimensional sensing, Modulation, Inspection, Image acquisition, CCD cameras, Image sensors, Data processing, Projection systems, Environmental sensing

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PROCEEDINGS ARTICLE | October 15, 2012

Image registration with fringe projection techniques: a simple approach to form a high-resolution image from multiple low-resolution images

Proc. SPIE. 8497, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications VI

KEYWORDS: Fringe analysis, Sun, Cameras, Image processing, Image resolution, Image registration, CCD cameras, Image enhancement, Resolution enhancement technologies, Phase shifts

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PROCEEDINGS ARTICLE | October 15, 2012

Speckle reduction for fringe patterns using a database system based on the empirical mode decomposition

Proc. SPIE. 8497, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications VI

KEYWORDS: Signal to noise ratio, Fringe analysis, Sun, Speckle, Databases, Wavelets, Fourier transforms, Interference (communication), Speckle pattern, Optimization (mathematics)

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PROCEEDINGS ARTICLE | September 8, 2011

Trace and profile measurements for dynamic objects

Proc. SPIE. 8120, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications V

KEYWORDS: Fringe analysis, Video, Lamps, Inspection, Fourier transforms, CCD cameras, 3D metrology, Binary data, 3D image processing, Evolutionary algorithms

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PROCEEDINGS ARTICLE | September 8, 2011

Speckle-reduction for fringe patterns using the 1D empirical mode decomposition

Proc. SPIE. 8120, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications V

KEYWORDS: Signal to noise ratio, Light sources, Fringe analysis, Speckle, Databases, CCD cameras, Speckle pattern, Pixel resolution, Signal generators, Michelson interferometers

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PROCEEDINGS ARTICLE | September 8, 2011

Color retrieval for fringe projection techniques

Proc. SPIE. 8120, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications V

KEYWORDS: Fringe analysis, 3D image enhancement, Inspection, CCD cameras, Image filtering, Image enhancement, 3D vision, Enhanced vision, 3D image processing, Bandpass filters

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PROCEEDINGS ARTICLE | September 8, 2011

Real-time profilometry using double fringe projection techniques: a compact design for endoscopes

Proc. SPIE. 8120, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications V

KEYWORDS: Diffraction, Fringe analysis, Holograms, Inspection, Endoscopes, CCD cameras, 3D metrology, Projection systems, Objectives, Binary data

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PROCEEDINGS ARTICLE | August 18, 2010

3D shape sensing using a phase mask to extend the depth measuring range

Proc. SPIE. 7781, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications IV

KEYWORDS: Microscopes, Optical transfer functions, 3D acquisition, 3D surface sensing, Inspection, Fourier transforms, Image acquisition, Phase shift keying, Projection systems, Sensing systems

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PROCEEDINGS ARTICLE | August 18, 2010

Profile measurements for images blurred by motion

Proc. SPIE. 7781, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications IV

KEYWORDS: Fringe analysis, Photonic crystal fibers, Modulation, Inspection, CCD cameras, Image sensors, 3D metrology, Motion measurement, Imaging arrays, 3D image processing

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PROCEEDINGS ARTICLE | August 18, 2010

Speed sensing using projected fringe profilometry

Proc. SPIE. 7781, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications IV

KEYWORDS: Fringe analysis, Modulation, Inspection, Image analysis, CCD cameras, Image sensors, Data processing, 3D metrology, Motion measurement, Environmental sensing

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PROCEEDINGS ARTICLE | August 18, 2010

A database system using the empirical mode decomposition to smooth subjective speckles in fringe patterns

Proc. SPIE. 7781, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications IV

KEYWORDS: Signal to noise ratio, Light sources, Fringe analysis, Speckle, Databases, Inspection, Computer simulations, Image filtering, Signal generators, Phase shifts

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PROCEEDINGS ARTICLE | February 8, 2010

Noise-reduction in fringe patterns based on the empirical mode decomposition

Proc. SPIE. 7613, Complex Light and Optical Forces IV

KEYWORDS: Signal to noise ratio, Fringe analysis, Statistical analysis, Image processing, Denoising, Inspection, Interferometry, Interference (communication), Computer simulations, Electronic filtering

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SPIE Journal Paper | July 1, 2009

Three-dimensional shape reconstruction from images blurred by motion

Su, Wei-Hung , Lee, Chao-Kuei

OE Vol. 48 Issue 07

KEYWORDS: 3D image processing, Inspection, 3D image reconstruction, Fringe analysis, Optical engineering, CCD cameras, Motion measurement, Fourier transforms, 3D metrology, Image sensors

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PROCEEDINGS ARTICLE | August 25, 2008

Projected fringe profilometry using the area-encoded algorithm for dynamic and complex objects

Proc. SPIE. 7056, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications II

KEYWORDS: Fringe analysis, Calibration, Inspection, Fourier transforms, Computer programming, CCD cameras, 3D metrology, Transmittance, Phase measurement, Binary data

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PROCEEDINGS ARTICLE | August 25, 2008

A 3D shape sensing system using multiple fringe projections from different partial views to form an entire shape

Proc. SPIE. 7056, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications II

KEYWORDS: Three dimensional sensing, Sensors, Calibration, Image segmentation, Inspection, Image registration, CCD cameras, 3D metrology, Sensing systems, Data fusion

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PROCEEDINGS ARTICLE | August 25, 2008

Speckles removal from interference patterns illuminated by coherent light using empirical mode decomposition

Proc. SPIE. 7056, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications II

KEYWORDS: Signal to noise ratio, Light sources, Fringe analysis, Data modeling, Speckle, Optical microscopy, Interference (communication), Optical metrology, Signal processing, Phase shifts

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PROCEEDINGS ARTICLE | August 25, 2008

Projected fringe profilometry using a holographic technique: a compact design for endoscopes

Proc. SPIE. 7056, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications II

KEYWORDS: Diffraction, Fringe analysis, Holograms, Holography, Inspection, Image acquisition, Endoscopes, 3D metrology, Projection systems, Objectives

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PROCEEDINGS ARTICLE | September 17, 2007

3D shape reconstruction using projected fringe profilometry for an image blurred by linear motion

Proc. SPIE. 6698, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications

KEYWORDS: Fringe analysis, 3D image reconstruction, Calibration, Inspection, Fourier transforms, 3D metrology, Projection systems, Shape analysis, Phase measurement, 3D image processing

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PROCEEDINGS ARTICLE | September 17, 2007

Time resolved profile measurements for ultra-fast vibrating objects

Proc. SPIE. 6698, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications

KEYWORDS: Fringe analysis, Sensors, Video, Inspection, Fourier transforms, CCD cameras, Image sensors, 3D metrology, Binary data, Phase shifts

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PROCEEDINGS ARTICLE | September 17, 2007

3D shape reconstruction using multiple projections: a method to eliminate shadowing for projected fringe profilometry

Proc. SPIE. 6698, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications

KEYWORDS: Fringe analysis, Calibration, Inspection, Fourier transforms, Computer programming, CCD cameras, 3D metrology, Projection systems, Shape analysis, Phase shifts

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PROCEEDINGS ARTICLE | September 17, 2007

Speckles removal from 3D images by empirical mode decomposition

Proc. SPIE. 6698, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications

KEYWORDS: Signal to noise ratio, Light sources, Photonic crystal fibers, 3D acquisition, 3D image reconstruction, Speckle, Interference (communication), Linear filtering, Optical interferometry, 3D image processing

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PROCEEDINGS ARTICLE | August 24, 2006

Projected fringe profilometry using a supercontinum light illumination for micro-scale measurements

Proc. SPIE. 6314, Photorefractive Fiber and Crystal Devices: Materials, Optical Properties, and Applications XII

KEYWORDS: Light sources, Fringe analysis, Photonic crystal fibers, Speckle, Calibration, Fiber lasers, 3D metrology, Projection systems, Nonlinear crystals, Light

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PROCEEDINGS ARTICLE | August 24, 2006

Projected fringe profilometry using a hologram for objects with large depth discontinuities

Proc. SPIE. 6314, Photorefractive Fiber and Crystal Devices: Materials, Optical Properties, and Applications XII

KEYWORDS: Diffraction, Fringe analysis, Holograms, Calibration, Inspection, Fourier transforms, Distortion, 3D metrology, Transmittance, Palladium

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PROCEEDINGS ARTICLE | September 8, 2005

Integration of segmented 3D image data measured by projected fringe profilometry using supercontinuum light

Proc. SPIE. 5911, Photorefractive Fiber and Crystal Devices: Materials, Optical Properties, and Applications XI

KEYWORDS: Fringe analysis, Photonic crystal fibers, Fluctuations and noise, Imaging systems, Image segmentation, CCD cameras, 3D metrology, Nonlinear crystals, 3D image processing, Light

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PROCEEDINGS ARTICLE | September 8, 2005

Projected fringe profilometry using holographic techniques for large-scale measurements

Proc. SPIE. 5911, Photorefractive Fiber and Crystal Devices: Materials, Optical Properties, and Applications XI

KEYWORDS: Fringe analysis, Holograms, Holography, Imaging systems, Calibration, Inspection, Distortion, 3D metrology, Projection systems, Optical calibration

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PROCEEDINGS ARTICLE | January 11, 2005

Design and fabrication of digital 2D fringe patterns and their application to accurate integration of segmented 3D image data

Proc. SPIE. 5642, Information Optics and Photonics Technology

KEYWORDS: Optical design, Fringe analysis, Image segmentation, Inspection, Image registration, Digital imaging, 3D metrology, Transmittance, 3D image processing, Phase shifts

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PROCEEDINGS ARTICLE | December 16, 2004

Design and fabrication of digital dual-frequency patterns for projected fringe profilometry

Proc. SPIE. 5606, Two- and Three-Dimensional Vision Systems for Inspection, Control, and Metrology II

KEYWORDS: Fabrication, Lithography, Optical design, Fringe analysis, Imaging systems, Inspection, 3D metrology, Transmittance, Charge-coupled devices, Phase shifts

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PROCEEDINGS ARTICLE | October 22, 2004

Design and fabrication of various digital fringe patterns for projected fringe profilometry

Proc. SPIE. 5560, Photorefractive Fiber and Crystal Devices: Materials, Optical Properties, and Applications X

KEYWORDS: Lithography, Optical design, Fringe analysis, Lithium, Imaging systems, CCD cameras, 3D metrology, Transmittance, Charge-coupled devices, Phase shifts

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PROCEEDINGS ARTICLE | October 22, 2004

Integration of segmented 3D image data measured by projected fringe profilometry

Proc. SPIE. 5560, Photorefractive Fiber and Crystal Devices: Materials, Optical Properties, and Applications X

KEYWORDS: Imaging systems, Calibration, Image segmentation, Distortion, Image registration, 3D metrology, Phase measurement, 3D image processing, Phase shifts, Data fusion

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PROCEEDINGS ARTICLE | October 21, 2003

A unique all-optic switch based on an innovatively designed liquid crystal waveguide

Proc. SPIE. 5206, Photorefractive Fiber and Crystal Devices: Materials, Optical Properties, and Applications IX

KEYWORDS: Refractive index, Mirrors, Switches, Switching, Waveguides, Electrodes, Polymers, Liquid crystals, Photomasks, Photonic integrated circuits

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SPIE Journal Paper | June 1, 2003

Fabrication of digital sinusoidal gratings and precisely controlled diffusive flats and their application to highly accurate projected fringe profilometry

Su, Wei-Hung , Liu, Hongyu , Richard, Karl , Yin, Shizhuo , Yu, Francis

OE Vol. 42 Issue 06

KEYWORDS: Calibration, Phase measurement, Phase shifts, Optical design, Teeth, Transmittance, Optical engineering, Charge-coupled devices, Distortion, 3D metrology

Showing 5 of 54 publications

Conference Committee Involvement (5)

Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XIII

11 August 2019 | San Diego, California, United States

Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XII

19 August 2018 | San Diego, California, United States

Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XI

6 August 2017 | San Diego, California, United States

Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications X

28 August 2016 | San Diego, California, United States

Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications IX

9 August 2015 | San Diego, California, United States

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