Prof. Wei-Hung Su Profile

Prof. Wei-Hung Su

Associate Professor at National Sun Yat-Sen Univ

SPIE Involvement:

Conference Program Committee | Author

Publications (50)

PROCEEDINGS ARTICLE | August 23, 2017

Mathematical expressions using fringe projections for transparent objects

Proc. SPIE. 10382, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XI

KEYWORDS: Fringe analysis, 3D metrology, Ray tracing, Optical inspection, CCD cameras, Refractive index, 3D image processing, Shape analysis, Photonic devices

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PROCEEDINGS ARTICLE | August 23, 2017

A scanning approach using a binary grid pattern for 3D shape measurements

Proc. SPIE. 10382, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XI

KEYWORDS: 3D metrology, Binary data, 3D surface sensing, Optical sensing, Optical inspection, Projection systems, Inspection, Photonic devices

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PROCEEDINGS ARTICLE | August 23, 2017

One shot profile measurements using a binary-encoded pattern

Proc. SPIE. 10382, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XI

KEYWORDS: Fringe analysis, Reflectivity, Optical inspection, Inspection, Cameras, Photonic devices

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PROCEEDINGS ARTICLE | August 23, 2017

Phase-shifting projected fringe profilometry using ternary-encoded patterns

Proc. SPIE. 10382, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XI

KEYWORDS: Fringe analysis, Phase shifts, Optical inspection, Data processing, Reliability, Photonic devices

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PROCEEDINGS ARTICLE | September 7, 2016

Fabrication of holographic materials by photo-induced polymers

Proc. SPIE. 9958, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications X

KEYWORDS: Holography, Holograms, Composites, Diffraction, Holographic materials, Polymers, Polymethylmethacrylate, Diffraction gratings, 3D image reconstruction, Optical storage

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PROCEEDINGS ARTICLE | September 7, 2016

Phase unwrapping using binary-encoded fringe pattern for phase-shifting projected fringe profilometry

Proc. SPIE. 9958, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications X

KEYWORDS: Fringe analysis, Phase shifts, Computer programming, Reflectivity, Binary data, Inspection, Transmittance, 3D metrology, Time metrology, Photonic crystal fibers

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PROCEEDINGS ARTICLE | September 7, 2016

Scanning fringe projection for 3D shape measurements

Proc. SPIE. 9958, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications X

KEYWORDS: 3D metrology, 3D image processing, Image processing, Inspection, CCD cameras, Bandpass filters, Fringe analysis, Fourier transforms, Beam splitters, Light sources

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PROCEEDINGS ARTICLE | September 7, 2016

A 3D translation stage calibrated with Michelson interferometers

Proc. SPIE. 9958, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications X

KEYWORDS: 3D metrology, Michelson interferometers, Mirrors, Beam splitters, Phase shifts, Calibration, Fourier transforms, Lithography, Interferometry, Distance measurement

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PROCEEDINGS ARTICLE | September 8, 2015

Projected fringe profilometry for metal surfaces

Proc. SPIE. 9586, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications IX

KEYWORDS: Metals, Fringe analysis, Inspection, CCD cameras, Mirrors, Calibration, Image sensors, Fourier transforms, 3D metrology, Imaging arrays

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PROCEEDINGS ARTICLE | August 26, 2015

Gray-level encoded fringe projection for profile measurements

Proc. SPIE. 9586, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications IX

KEYWORDS: Binary data, Fourier transforms, Inspection, Computer programming, Reflectivity, Fringe analysis, 3D metrology, Transmittance, Image filtering, Tolerancing

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PROCEEDINGS ARTICLE | August 26, 2015

A reliable image processing algorithm using the scanning fringe projection for 3D profile measurements

Proc. SPIE. 9586, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications IX

KEYWORDS: Inspection, 3D metrology, 3D image processing, Fringe analysis, CCD cameras, Image processing, Cameras, Beam splitters, Image filtering, 3D image enhancement

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PROCEEDINGS ARTICLE | August 26, 2015

Three-dimensional shape measurements using endoscopes

Proc. SPIE. 9586, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications IX

KEYWORDS: Holograms, Endoscopes, Inspection, Volume holography, Fringe analysis, Silica, Holography, Diffraction, CCD cameras, Beam splitters

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PROCEEDINGS ARTICLE | September 5, 2014

Projected fringe profilometry for non-diffusive objects

Proc. SPIE. 9200, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications VIII

KEYWORDS: Holograms, Fringe analysis, Inspection, Glasses, 3D metrology, CCD cameras, Reflection, Mirrors, Projection devices, Holography

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PROCEEDINGS ARTICLE | September 5, 2014

3D shape measurements for plano-convex lenses using fringe projection techniques

Proc. SPIE. 9200, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications VIII

KEYWORDS: Inspection, 3D metrology, Fringe analysis, CCD cameras, Shape analysis, Refractive index, 3D image processing, Lenses, Fourier transforms, Light sources

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PROCEEDINGS ARTICLE | September 5, 2014

Design of the binary-encoded fringe pattern for projected fringe profilometr

Proc. SPIE. 9200, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications VIII

KEYWORDS: Fringe analysis, Binary data, Transmittance, Inspection, Fourier transforms, 3D metrology, Lithography, Fabrication, Tolerancing, Projection systems

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PROCEEDINGS ARTICLE | September 5, 2014

A scanning approach using fringe projection techniques for 3D profile measurements

Proc. SPIE. 9200, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications VIII

KEYWORDS: 3D metrology, Inspection, CCD cameras, Fringe analysis, Cameras, 3D image processing, Fourier transforms, Light sources, Beam splitters, Photonic crystal fibers

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PROCEEDINGS ARTICLE | September 25, 2013

Using a projected fringe pattern to identify the focused image and its application to 3D shape measurements

Proc. SPIE. 8847, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications VII

KEYWORDS: 3D metrology, Inspection, Fringe analysis, 3D image processing, CCD cameras, Cameras, 3D applications, Fourier transforms, Photonic crystal fibers, Sensors

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PROCEEDINGS ARTICLE | September 25, 2013

3D shape measurements for non-diffusive objects using fringe projection techniques

Proc. SPIE. 8847, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications VII

KEYWORDS: 3D metrology, Holograms, Inspection, Fringe analysis, Glasses, CCD cameras, Reflection, Holography, Image acquisition, Mirrors

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PROCEEDINGS ARTICLE | September 25, 2013

Design of the optical concentrator using holographic techniques for solar cells

Proc. SPIE. 8847, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications VII

KEYWORDS: Holograms, Solar cells, Solar concentrators, Diffraction, Lenticular lenses, Holography, Optical design, Reflectivity, Solar energy, Spherical lenses

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PROCEEDINGS ARTICLE | October 15, 2012

Image registration with fringe projection techniques: a simple approach to form a high-resolution image from multiple low-resolution images

Proc. SPIE. 8497, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications VI

KEYWORDS: Image registration, Image enhancement, Image resolution, Cameras, CCD cameras, Resolution enhancement technologies, Phase shifts, Fringe analysis, Sun, Image processing

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PROCEEDINGS ARTICLE | October 15, 2012

Speckle reduction for fringe patterns using a database system based on the empirical mode decomposition

Proc. SPIE. 8497, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications VI

KEYWORDS: Speckle, Fringe analysis, Databases, Signal to noise ratio, Speckle pattern, Interference (communication), Sun, Optimization (mathematics), Fourier transforms, Wavelets

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PROCEEDINGS ARTICLE | October 15, 2012

Deformation measurements using projected fringe profilometry

Proc. SPIE. 8497, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications VI

KEYWORDS: Inspection, Fringe analysis, CCD cameras, Data processing, Environmental sensing, Image sensors, Modulation, Three dimensional sensing, Projection systems, Image acquisition

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PROCEEDINGS ARTICLE | September 8, 2011

Color retrieval for fringe projection techniques

Proc. SPIE. 8120, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications V

KEYWORDS: Bandpass filters, 3D image enhancement, Inspection, 3D vision, Image filtering, Enhanced vision, 3D image processing, Image enhancement, Fringe analysis, CCD cameras

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PROCEEDINGS ARTICLE | September 8, 2011

Speckle-reduction for fringe patterns using the 1D empirical mode decomposition

Proc. SPIE. 8120, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications V

KEYWORDS: Speckle, Fringe analysis, Databases, Signal generators, Speckle pattern, CCD cameras, Signal to noise ratio, Light sources, Pixel resolution, Michelson interferometers

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PROCEEDINGS ARTICLE | September 8, 2011

Trace and profile measurements for dynamic objects

Proc. SPIE. 8120, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications V

KEYWORDS: Fringe analysis, Inspection, 3D metrology, Fourier transforms, Lamps, CCD cameras, Binary data, 3D image processing, Evolutionary algorithms, Video

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PROCEEDINGS ARTICLE | September 8, 2011

Real-time profilometry using double fringe projection techniques: a compact design for endoscopes

Proc. SPIE. 8120, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications V

KEYWORDS: Inspection, Fringe analysis, Endoscopes, 3D metrology, Holograms, Binary data, Projection systems, Objectives, CCD cameras, Diffraction

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PROCEEDINGS ARTICLE | August 18, 2010

Profile measurements for images blurred by motion

Proc. SPIE. 7781, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications IV

KEYWORDS: 3D metrology, Fringe analysis, Motion measurement, CCD cameras, 3D image processing, Inspection, Image sensors, Imaging arrays, Modulation, Photonic crystal fibers

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PROCEEDINGS ARTICLE | August 18, 2010

3D shape sensing using a phase mask to extend the depth measuring range

Proc. SPIE. 7781, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications IV

KEYWORDS: Microscopes, Sensing systems, Image acquisition, Phase shift keying, Fourier transforms, Optical transfer functions, Inspection, 3D surface sensing, 3D acquisition, Projection systems

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PROCEEDINGS ARTICLE | August 18, 2010

A database system using the empirical mode decomposition to smooth subjective speckles in fringe patterns

Proc. SPIE. 7781, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications IV

KEYWORDS: Databases, Fringe analysis, Signal generators, Speckle, Computer simulations, Signal to noise ratio, Phase shifts, Image filtering, Light sources, Inspection

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PROCEEDINGS ARTICLE | August 18, 2010

Speed sensing using projected fringe profilometry

Proc. SPIE. 7781, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications IV

KEYWORDS: Fringe analysis, CCD cameras, 3D metrology, Data processing, Environmental sensing, Inspection, Image sensors, Modulation, Image analysis, Motion measurement

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PROCEEDINGS ARTICLE | February 8, 2010

Noise-reduction in fringe patterns based on the empirical mode decomposition

Proc. SPIE. 7613, Complex Light and Optical Forces IV

KEYWORDS: Signal to noise ratio, Fringe analysis, Interference (communication), Image processing, Statistical analysis, Interferometry, Denoising, Computer simulations, Inspection, Electronic filtering

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SPIE Journal Paper | July 1, 2009

Three-dimensional shape reconstruction from images blurred by motion

Su, Wei-Hung , Lee, Chao-Kuei

OE Vol. 48 Issue 07

KEYWORDS: 3D image processing, Inspection, 3D image reconstruction, Fringe analysis, Optical engineering, CCD cameras, Motion measurement, Fourier transforms, 3D metrology, Image sensors

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PROCEEDINGS ARTICLE | August 25, 2008

Projected fringe profilometry using a holographic technique: a compact design for endoscopes

Proc. SPIE. 7056, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications II

KEYWORDS: Endoscopes, 3D metrology, Diffraction, Inspection, Projection systems, Holograms, Objectives, Holography, Image acquisition, Fringe analysis

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PROCEEDINGS ARTICLE | August 25, 2008

A 3D shape sensing system using multiple fringe projections from different partial views to form an entire shape

Proc. SPIE. 7056, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications II

KEYWORDS: Calibration, Image segmentation, Sensing systems, Image registration, Inspection, 3D metrology, Sensors, Data fusion, Three dimensional sensing, CCD cameras

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PROCEEDINGS ARTICLE | August 25, 2008

Speckles removal from interference patterns illuminated by coherent light using empirical mode decomposition

Proc. SPIE. 7056, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications II

KEYWORDS: Speckle, Fringe analysis, Signal to noise ratio, Light sources, Phase shifts, Interference (communication), Data modeling, Signal processing, Optical metrology, Optical microscopy

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PROCEEDINGS ARTICLE | August 25, 2008

Projected fringe profilometry using the area-encoded algorithm for dynamic and complex objects

Proc. SPIE. 7056, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications II

KEYWORDS: 3D metrology, Binary data, Fringe analysis, Inspection, Fourier transforms, Computer programming, Calibration, Transmittance, CCD cameras, Phase measurement

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PROCEEDINGS ARTICLE | September 17, 2007

Speckles removal from 3D images by empirical mode decomposition

Proc. SPIE. 6698, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications

KEYWORDS: Signal to noise ratio, 3D image processing, Speckle, 3D image reconstruction, Linear filtering, Light sources, Interference (communication), 3D acquisition, Optical interferometry, Photonic crystal fibers

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PROCEEDINGS ARTICLE | September 17, 2007

Time resolved profile measurements for ultra-fast vibrating objects

Proc. SPIE. 6698, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications

KEYWORDS: Binary data, Fringe analysis, CCD cameras, 3D metrology, Fourier transforms, Inspection, Image sensors, Phase shifts, Video, Sensors

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PROCEEDINGS ARTICLE | September 17, 2007

3D shape reconstruction using multiple projections: a method to eliminate shadowing for projected fringe profilometry

Proc. SPIE. 6698, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications

KEYWORDS: Calibration, Fringe analysis, Fourier transforms, Inspection, Projection systems, 3D metrology, CCD cameras, Shape analysis, Phase shifts, Computer programming

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PROCEEDINGS ARTICLE | September 17, 2007

3D shape reconstruction using projected fringe profilometry for an image blurred by linear motion

Proc. SPIE. 6698, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications

KEYWORDS: 3D metrology, 3D image reconstruction, 3D image processing, Calibration, Fringe analysis, Fourier transforms, Phase measurement, Inspection, Projection systems, Shape analysis

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PROCEEDINGS ARTICLE | August 24, 2006

Projected fringe profilometry using a supercontinum light illumination for micro-scale measurements

Proc. SPIE. 6314, Photorefractive Fiber and Crystal Devices: Materials, Optical Properties, and Applications XII

KEYWORDS: Calibration, Photonic crystal fibers, Light, Light sources, Speckle, Fringe analysis, Fiber lasers, Nonlinear crystals, 3D metrology, Projection systems

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PROCEEDINGS ARTICLE | August 24, 2006

Projected fringe profilometry using a hologram for objects with large depth discontinuities

Proc. SPIE. 6314, Photorefractive Fiber and Crystal Devices: Materials, Optical Properties, and Applications XII

KEYWORDS: Fringe analysis, Holograms, 3D metrology, Transmittance, Inspection, Palladium, Fourier transforms, Calibration, Distortion, Diffraction

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PROCEEDINGS ARTICLE | September 8, 2005

Integration of segmented 3D image data measured by projected fringe profilometry using supercontinuum light

Proc. SPIE. 5911, Photorefractive Fiber and Crystal Devices: Materials, Optical Properties, and Applications XI

KEYWORDS: Image segmentation, 3D metrology, 3D image processing, Fluctuations and noise, Photonic crystal fibers, Fringe analysis, Nonlinear crystals, Light, Imaging systems, CCD cameras

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PROCEEDINGS ARTICLE | September 8, 2005

Projected fringe profilometry using holographic techniques for large-scale measurements

Proc. SPIE. 5911, Photorefractive Fiber and Crystal Devices: Materials, Optical Properties, and Applications XI

KEYWORDS: Calibration, Fringe analysis, Holography, Distortion, Holograms, Imaging systems, Projection systems, 3D metrology, Inspection, Optical calibration

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PROCEEDINGS ARTICLE | January 11, 2005

Design and fabrication of digital 2D fringe patterns and their application to accurate integration of segmented 3D image data

Proc. SPIE. 5642, Information Optics and Photonics Technology

KEYWORDS: Fringe analysis, Image segmentation, 3D image processing, Image registration, Transmittance, Phase shifts, Optical design, Digital imaging, 3D metrology, Inspection

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PROCEEDINGS ARTICLE | December 16, 2004

Design and fabrication of digital dual-frequency patterns for projected fringe profilometry

Proc. SPIE. 5606, Two- and Three-Dimensional Vision Systems for Inspection, Control, and Metrology II

KEYWORDS: Fringe analysis, Transmittance, Phase shifts, Charge-coupled devices, Optical design, 3D metrology, Fabrication, Lithography, Imaging systems, Inspection

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PROCEEDINGS ARTICLE | October 22, 2004

Integration of segmented 3D image data measured by projected fringe profilometry

Proc. SPIE. 5560, Photorefractive Fiber and Crystal Devices: Materials, Optical Properties, and Applications X

KEYWORDS: Calibration, Image segmentation, Image registration, 3D metrology, 3D image processing, Phase shifts, Distortion, Imaging systems, Phase measurement, Data fusion

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PROCEEDINGS ARTICLE | October 22, 2004

Design and fabrication of various digital fringe patterns for projected fringe profilometry

Proc. SPIE. 5560, Photorefractive Fiber and Crystal Devices: Materials, Optical Properties, and Applications X

KEYWORDS: Fringe analysis, Transmittance, Phase shifts, Optical design, Charge-coupled devices, CCD cameras, Imaging systems, Lithography, 3D metrology, Lithium

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PROCEEDINGS ARTICLE | October 21, 2003

A unique all-optic switch based on an innovatively designed liquid crystal waveguide

Proc. SPIE. 5206, Photorefractive Fiber and Crystal Devices: Materials, Optical Properties, and Applications IX

KEYWORDS: Waveguides, Switches, Refractive index, Liquid crystals, Mirrors, Switching, Polymers, Photomasks, Photonic integrated circuits, Electrodes

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SPIE Journal Paper | June 1, 2003

Fabrication of digital sinusoidal gratings and precisely controlled diffusive flats and their application to highly accurate projected fringe profilometry

Su, Wei-Hung , Liu, Hongyu , Richard, Karl , Yin, Shizhuo , Yu, Francis

OE Vol. 42 Issue 06

KEYWORDS: Calibration, Phase measurement, Phase shifts, Optical design, Teeth, Transmittance, Optical engineering, Charge-coupled devices, Distortion, 3D metrology

Showing 5 of 50 publications

Conference Committee Involvement (4)

Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XII

19 August 2018 | San Diego, California, United States

Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XI

6 August 2017 | San Diego, California, United States

Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications X

28 August 2016 | San Diego, California, United States

Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications IX

9 August 2015 | San Diego, California, United States

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