Mr. Wei-Jei Peng
Associate Researcher at Instrument Technology Research Ctr
SPIE Involvement:
Author
Area of Expertise:
Image optics , Illumination optics , Optical instruments design , Projection design , Optical metrology
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Profile Summary

Mr. Wei-Jei Peng is currently an associate researcher in National Applied Research Laboratories (NARLabs), Instrument Technology Research Center (ITRC) of Taiwan. He received his M.S. in Department of Optics and Photonics from National Central University in 2005. His research interests are in the area of image optics, illumination optics, optical instruments design, projection design, and optical metrology.
Publications (17)

PROCEEDINGS ARTICLE | June 15, 2018
Proc. SPIE. 10692, Optical Fabrication, Testing, and Metrology VI
KEYWORDS: Mirrors, Diamond turning, Manufacturing, Head, Servomechanisms, Freeform optics, Heads up displays, Optics manufacturing, Off axis mirrors, Surface finishing

PROCEEDINGS ARTICLE | February 22, 2018
Proc. SPIE. 10539, Photonic Instrumentation Engineering V
KEYWORDS: Laser sources, Sensors

PROCEEDINGS ARTICLE | February 22, 2018
Proc. SPIE. 10539, Photonic Instrumentation Engineering V
KEYWORDS: Optical design, CMOS sensors, Lenses, Cameras, Image resolution, Distortion, Lens design, Image sensors, Modulation transfer functions, Spatial resolution

PROCEEDINGS ARTICLE | October 16, 2017
Proc. SPIE. 10448, Optifab 2017
KEYWORDS: Optical design, Diamond turning, Diamond, Diamond machining, Manufacturing, Zernike polynomials, Servomechanisms, Freeform optics, Optics manufacturing, Surface finishing

PROCEEDINGS ARTICLE | August 23, 2017
Proc. SPIE. 10375, Current Developments in Lens Design and Optical Engineering XVIII
KEYWORDS: Monochromatic aberrations, Optical spheres, Visualization, Interferometers, Retina, Lens design, Aspheric lenses, Contact lenses, Spherical lenses, Eye models

PROCEEDINGS ARTICLE | August 22, 2017
Proc. SPIE. 10377, Optical System Alignment, Tolerancing, and Verification XI
KEYWORDS: Wavefronts, Wavefront compensation, Kinematics, Image quality, Integrated circuits, Lithographic lenses

Showing 5 of 17 publications
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