Wei Nong Wang
at National Institute of Metrology
SPIE Involvement:
Author
Publications (8)

Proceedings Article | 7 March 2019 Paper
Proceedings Volume 11053, 110532V (2019) https://doi.org/10.1117/12.2512066
KEYWORDS: Standards development, Software development, Data processing, Metrology, Tolerancing, Matrices, Nanolithography

Proceedings Article | 24 November 2016 Paper
Hengzheng Wei, Weinong Wang, Limei Pei, Guoying Ren
Proceedings Volume 10023, 1002309 (2016) https://doi.org/10.1117/12.2244876
KEYWORDS: Photogrammetry, Retroreflectors, Calibration, Digital photography, Reflectivity, Metrology, Metals, Imaging systems, Standards development, Optical sensors

Proceedings Article | 6 March 2015 Paper
Hengzheng Wei, Weinong Wang, Guoying Ren, Limei Pei
Proceedings Volume 9446, 944613 (2015) https://doi.org/10.1117/12.2180721
KEYWORDS: Optical spheres, Interferometers, Calibration, Metrology, Laser metrology, Ceramics, Laser development, Error analysis, Temperature metrology, Instrumentation engineering

Proceedings Article | 10 October 2013 Paper
Proceedings Volume 8916, 891632 (2013) https://doi.org/10.1117/12.2035806
KEYWORDS: Standards development, Charge-coupled devices, Calibration, Image sensors, Interferometers, Head, Microscopes, CCD image sensors, Optical spheres, Imaging systems

Proceedings Article | 12 November 2010 Paper
Hengzheng Wei, Weinong Wang, Guoying Ren, Limei Pei
Proceedings Volume 7855, 785524 (2010) https://doi.org/10.1117/12.871046
KEYWORDS: Microscopes, Imaging systems, Edge detection, Metrology, Diffraction, Calibration, Charge-coupled devices, Inspection, Image processing, CCD cameras

Showing 5 of 8 publications
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