Dr. Wei Chu
at National Institute of Standards and Technology
SPIE Involvement:
Author
Publications (6)

Proceedings Article | 10 June 2010
Proc. SPIE. 7729, Scanning Microscopy 2010
KEYWORDS: Optical imaging, Confocal microscopy, Microscopes, Optical microscopes, Imaging systems, Databases, Image acquisition, Objectives, Firearms, Standards development

Proceedings Article | 3 June 2010
Proc. SPIE. 7729, Scanning Microscopy 2010
KEYWORDS: Microscopes, Edge detection, Image compression, Sensors, Image processing, Forensic science, Manufacturing, System identification, Firearms, Binary data

Proceedings Article | 5 April 2007
Proc. SPIE. 6518, Metrology, Inspection, and Process Control for Microlithography XXI
KEYWORDS: Actuators, Data modeling, Sensors, Scanners, Distortion, Scanning probe microscopy, Statistical modeling, Systems modeling, Scanning tunneling microscopy, Scanning probe microscopes

Proceedings Article | 23 February 2006
Proc. SPIE. 6150, 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
KEYWORDS: Edge detection, Lithium, Image processing, Atomic force microscopy, Data processing, Neural networks, Line width roughness, Line edge roughness, Binary data, Edge roughness

Proceedings Article | 20 August 2004
Proc. SPIE. 5446, Photomask and Next-Generation Lithography Mask Technology XI
KEYWORDS: Image fusion, Metrology, Error analysis, Distortion, Image registration, Atomic force microscopy, Electrical engineering, Standards development, 3D image processing, Carbon nanotubes

Showing 5 of 6 publications
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top