Mr. Wei Feng
Student at Sichuan Univ
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | August 7, 2015
Proc. SPIE. 9623, 2015 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
KEYWORDS: Fringe analysis, Imaging systems, Reliability, CCD cameras, Heterodyning, 3D metrology, Projection systems, Information technology, Digital micromirror devices, Structured light

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