Dr. Wei Gu
at Institute of Optics and Electronics CAS
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | September 18, 2014
Proc. SPIE. 9282, 7th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
KEYWORDS: Electronics, Statistical analysis, Interferometers, Error analysis, Interferometry, Optical fabrication, Optical testing, Zernike polynomials, Finite element methods, Analytical research

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