Wei Gong
at Tongji Univ
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | September 19, 2018
Proc. SPIE. 10747, Optical System Alignment, Tolerancing, and Verification XII
KEYWORDS: Refractive index, Prisms, Lithium, Error analysis, Nickel, Refraction, Ray tracing, Bismuth, Mechanical engineering, Assembly tolerances

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