Wei Jia
Founder and CEO, TyponTeq at Beijing Institute of Technology
SPIE Involvement:
Author
Area of Expertise:
Image , Image Processing , Optical Imaging , Imaging , Color Space
Websites:
Profile Summary

Used to be one of the top few system engineers in Avionics in China in 1980-1990
Service Engingeers and Support Engineers in GE Medical System China
Technical Manager in Konica medical China
Founder of Typonteq Co., Ltd.
Inventor of EDOF(Extension of Depth of Field) technology with symmetric wavefront coding,
Proposed the concept of EIDOF(Extension of Iris & DOF), Taking the leadership in inventing iLens 1610 with EIDOF technology.
Publications (5)

Proceedings Article | 9 September 2015
Proc. SPIE. 9598, Optics and Photonics for Information Processing IX
KEYWORDS: Signal to noise ratio, Image compression, Imaging systems, Image processing, Image restoration, Interference (communication), Wavefronts, Image quality, Modulation transfer functions, Filtering (signal processing)

Proceedings Article | 12 September 2014
Proc. SPIE. 9193, Novel Optical Systems Design and Optimization XVII
KEYWORDS: Chromatic aberrations, Monochromatic aberrations, Optical design, Imaging systems, Image processing, Wavefronts, Optoelectronics, Objectives, Modulation transfer functions, Optical aberrations

Proceedings Article | 23 December 2013
Proc. SPIE. 9043, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Devices and Optical Signal Processing
KEYWORDS: Diffraction, Point spread functions, Super resolution, Modulation, Dispersion, Fourier transforms, Numerical simulations, Computer simulations, Far-field diffraction, Transmittance

Proceedings Article | 19 December 2013
Proc. SPIE. 9045, 2013 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology
KEYWORDS: Point spread functions, Image compression, Digital image processing, Imaging systems, Image processing, Wavelets, Image restoration, Image quality, Image filtering, Filtering (signal processing)

Proceedings Article | 26 November 2012
Proc. SPIE. 8557, Optical Design and Testing V
KEYWORDS: Staring arrays, Microelectromechanical systems, Infrared imaging, Optical transfer functions, Point spread functions, Imaging systems, Infrared radiation, Charge-coupled devices, Modulation transfer functions, Electronic filtering

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