Mr. Wei Jiang
at Beijing Institute of Technology
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | December 30, 2004
Proc. SPIE. 5641, MEMS/MOEMS Technologies and Applications II
KEYWORDS: Microelectromechanical systems, Reflectors, Fabry–Perot interferometers, Electrodes, Silicon, Reflectivity, Wavelength division multiplexing, Finite element methods, Tunable filters, Channel projecting optics

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