Wei Leng
at China Academy of Space Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 8 November 2018
Proc. SPIE. 10819, Optical Metrology and Inspection for Industrial Applications V
KEYWORDS: Reflectivity, Ultraviolet radiation, Control systems, Spectrophotometry, Integrating spheres, Space operations, Environmental sensing, Sensors, Cryogenics, Error analysis, In situ metrology, Vacuum equipment, Vacuum ultraviolet

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