Wei Leng
at China Academy of Space Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 8 November 2018 Paper
Proc. SPIE. 10819, Optical Metrology and Inspection for Industrial Applications V
KEYWORDS: Sensors, Ultraviolet radiation, In situ metrology, Error analysis, Reflectivity, Control systems, Integrating spheres, Space operations, Vacuum ultraviolet, Spectrophotometry, Environmental sensing, Cryogenics, Vacuum equipment

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top