Mr. Wei Wei
at Tianjin Univ
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | January 20, 2005
Proc. SPIE. 5633, Advanced Materials and Devices for Sensing and Imaging II
KEYWORDS: Imaging systems, Sensors, Calibration, Inspection, Computing systems, CCD cameras, Image sensors, 3D metrology, Sensor calibration, 3D image processing

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