Wei Yin
at Nanjing Univ of Aeronautics and Astronautics
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 24 November 2016
Proc. SPIE. 10023, Optical Metrology and Inspection for Industrial Applications IV
KEYWORDS: 3D metrology, RGB color model, Phase shifting, 3D modeling, Optical metrology, Structured light, Cameras, Projection systems, Phase shifts, Optical testing

Proceedings Article | 24 November 2016
Proc. SPIE. 10023, Optical Metrology and Inspection for Industrial Applications IV
KEYWORDS: 3D metrology, Cameras, Calibration, Imaging systems, Radon, 3D scanning, Laser scanners, Laser systems engineering, 3D modeling, Image segmentation

SPIE Journal Paper | 20 September 2016
OE Vol. 55 Issue 09
KEYWORDS: RGB color model, Colorimetry, 3D acquisition, Sensors, 3D modeling, Optical engineering, 3D image processing, Cameras, Computer programming, 3D metrology

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