Dr. Wei Zhou Profile

Dr. Wei Zhou

Director of Optical Testing at Huawei

SPIE Involvement:

Author | Science Fair Judge

Publications (6)

Proceedings Article | 20 September 2013

New generation CMOS 2D imager evaluation and qualification for semiconductor inspection applications

Wei Zhou, Darcy Hart

Proc. SPIE. 8819, Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VII

KEYWORDS: Semiconductors, Signal to noise ratio, Imaging systems, Cameras, Sensors, Inspection, Image resolution, CMOS technology, Neodymium, Content addressable memory

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Proceedings Article | 20 September 2013

Illumination design for semiconductor backlight inspection and application extensions

Wei Zhou, Todd Rutherford, Darcy Hart

Proc. SPIE. 8819, Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VII

KEYWORDS: Semiconductors, Light emitting diodes, Waveguides, Silicon, Manufacturing, Inspection, Collimators, Collimation, Geometrical optics, Semiconducting wafers

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Proceedings Article | 6 April 2012

Technology review for silicon imagers-based see-through-silicon inspection and metrology

Wei Zhou, Max Guest, Darcy Hart

Proc. SPIE. 8324, Metrology, Inspection, and Process Control for Microlithography XXVI

KEYWORDS: Semiconductors, Signal to noise ratio, Indium gallium arsenide, Metrology, Imaging systems, Cameras, Silicon, Inspection, Semiconducting wafers, Device simulation

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Proceedings Article | 24 September 2011

Laser dark-field illumination system modeling for semiconductor inspection applications

Wei Zhou, Darcy Hart, Rajiv Roy

Proc. SPIE. 8170, Illumination Optics II

KEYWORDS: Semiconductors, Microscopes, Photons, Laser applications, Inspection, Laser beam propagation, Semiconductor lasers, Semiconducting wafers, Signal detection, Systems modeling

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Proceedings Article | 20 September 2011

See-through-silicon inspection application studies based on traditional silicon imager

Wei Zhou, Darcy Hart, Noah Bock, Rolf Shervey

Proc. SPIE. 8105, Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors V

KEYWORDS: Signal to noise ratio, Reflection, Imaging systems, Sensors, Image processing, Silicon, Inspection, Machine vision, Human vision and color perception, Semiconducting wafers

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Proceedings Article | 27 September 2007

GRIN-optics-based hyperspectral imaging micro-sensor

Wei Zhou, James Leger

Proc. SPIE. 6765, Next-Generation Spectroscopic Technologies

KEYWORDS: Hyperspectral imaging, GRIN lenses, Diffraction, Optical design, Sensors, Etching, Spectroscopy, Image sensors, Channel projecting optics, Diffraction gratings

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Showing 5 of 6 publications

Conference Committee Involvement (3)

Instrumentation, Metrology, and Standards for Nanomanufacturing VIII

20 August 2014 | San Diego, California, United States

Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VII

28 August 2013 | San Diego, California, United States

Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VI

13 August 2012 | San Diego, California, United States

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