Weichang Xie
at Univ Kassel
SPIE Involvement:
Author
Publications (6)

Proceedings Article | 26 June 2017
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Confocal microscopy, Diffraction, Edge detection, 3D surface sensing, Calibration, Optical coherence tomography, Interferometry, 3D metrology, Signal analyzers

Proceedings Article | 26 April 2016
Proc. SPIE. 9890, Optical Micro- and Nanometrology VI
KEYWORDS: Confocal microscopy, Microscopes, Diffraction, Apodization, Light emitting diodes, Mirau interferometers, Imaging systems, Interferometers, Interferometers, Interferometry, Tomography, 3D metrology, Objectives, Optical tomography, Blue light emitting diodes

Proceedings Article | 24 August 2015
Proc. SPIE. 9660, SPECKLE 2015: VI International Conference on Speckle Metrology
KEYWORDS: Temporal coherence, Microscopes, Diffraction, Mirrors, Polarization, Spatial frequencies, Interferometers, Microscopy, 3D metrology, Objectives

Proceedings Article | 22 June 2013
Proc. SPIE. 8769, International Conference on Optics in Precision Engineering and Nanotechnology (icOPEN2013)
KEYWORDS: Microscopes, Diffraction, Imaging systems, Interferometers, Image resolution, Interferometry, Linear filtering, Objectives, Modulation transfer functions, Optics manufacturing

Proceedings Article | 13 May 2013
Proc. SPIE. 8788, Optical Measurement Systems for Industrial Inspection VIII
KEYWORDS: Chromatic aberrations, Microscopes, Mirrors, Aberration correction, Beam splitters, Interferometers, Interferometry, Objectives, Modulation transfer functions, Michelson interferometers

Showing 5 of 6 publications
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