Dr. Weijie Shi
at Harbin Institute of Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 28 November 2007
Proc. SPIE. 6834, Optical Design and Testing III
KEYWORDS: Semiconductors, Image fusion, Mirrors, Light sources, Polishing, Digital image processing, Defect detection, Manufacturing, Semiconducting wafers, Surface finishing

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top