Dr. Weijuan Qu
at Ngee Ann Polytechnic
SPIE Involvement:
Author
Publications (31)

SPIE Journal Paper | March 20, 2018
OE Vol. 57 Issue 03
KEYWORDS: Microlens, Calibration, Microlens array, Optical engineering, Sensors, Error analysis, Detector arrays, Cameras, Image processing, Image resolution

SPIE Journal Paper | February 23, 2018
OE Vol. 57 Issue 02
KEYWORDS: Digital holography, Holograms, Holography, Mirrors, Objectives, Microscopy, Semiconducting wafers, Beam splitters, Interferometry, Optical engineering

PROCEEDINGS ARTICLE | October 24, 2017
Proc. SPIE. 10458, AOPC 2017: 3D Measurement Technology for Intelligent Manufacturing
KEYWORDS: Microscopes, 3D image reconstruction, Opacity, Inspection, Phase retrieval, Wafer inspection

PROCEEDINGS ARTICLE | July 17, 2015
Proc. SPIE. 9524, International Conference on Optical and Photonic Engineering (icOPEN 2015)
KEYWORDS: Microelectromechanical systems, Microscopes, Holograms, Holography, Digital holography, Microscopy, Charge-coupled devices, Fiber couplers, 3D image processing, 3D microstructuring

PROCEEDINGS ARTICLE | July 17, 2015
Proc. SPIE. 9524, International Conference on Optical and Photonic Engineering (icOPEN 2015)
KEYWORDS: Holograms, Holography, 3D image reconstruction, Digital holography, Cameras, Image resolution, Multiplexing, CCD cameras, Spatial resolution, Molybdenum

PROCEEDINGS ARTICLE | July 17, 2015
Proc. SPIE. 9524, International Conference on Optical and Photonic Engineering (icOPEN 2015)
KEYWORDS: Wafer-level optics, Microscopes, Holograms, Digital holography, Cameras, Inspection, Wavefronts, Phase imaging, Phase measurement, Digital recording

Showing 5 of 31 publications
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