Dr. Weiqiang Zhao
at National Institute of Metrology
SPIE Involvement:
Author
Publications (7)

Proceedings Article | 10 October 2020 Poster + Paper
Proc. SPIE. 11552, Optical Metrology and Inspection for Industrial Applications VII
KEYWORDS: Indium gallium arsenide, Calibration, Photodiodes, Cryogenics, Radiometry, Spectral calibration, Metrology, Monochromators, Light sources, Radio optics

Proceedings Article | 18 November 2019 Paper
Proc. SPIE. 11189, Optical Metrology and Inspection for Industrial Applications VI
KEYWORDS: Light emitting diodes, Photometry, Monte Carlo methods, LED lighting, Light sources and illumination, LED displays, Luminous efficiency, Metrology, Numerical simulations, Mathematical modeling

Proceedings Article | 18 November 2019 Paper
Proc. SPIE. 11189, Optical Metrology and Inspection for Industrial Applications VI
KEYWORDS: Lamps, Light emitting diodes, Light sources, Data modeling, Optical testing, Standards development, Head

Proceedings Article | 2 November 2018 Paper
Proc. SPIE. 10819, Optical Metrology and Inspection for Industrial Applications V
KEYWORDS: Goniophotometry, Light sources, Metrology, Standards development, Signal processing, Lamps, Light emitting diodes, Photodetectors, Visible radiation

Proceedings Article | 24 November 2016 Paper
Proc. SPIE. 10023, Optical Metrology and Inspection for Industrial Applications IV
KEYWORDS: Calibration, Spectroscopy, Spherical lenses, Lamps, Spectral calibration, Light emitting diodes, Metrology, Silicon, Photodetectors, Optical spheres

Showing 5 of 7 publications
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