Prof. Weishi Li
at Hefei University of Technology
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | June 13, 2017
Proc. SPIE. 10449, Fifth International Conference on Optical and Photonics Engineering
KEYWORDS: Fringe analysis, Lenses, Cameras, Calibration, Distortion, CCD cameras, 3D metrology, Projection systems, 3D image processing, Phase shifts

SPIE Journal Paper | June 16, 2014
OE Vol. 53 Issue 12
KEYWORDS: Precision measurement, Superconductors, Inspection, Assembly tolerances, Optical testing, Distance measurement, Optical engineering, Metrology, Lithium, Optical tracking

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