Prof. Weishi Li
at Hefei University of Technology
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 13 June 2017
Proc. SPIE. 10449, Fifth International Conference on Optical and Photonics Engineering
KEYWORDS: Projection systems, Distortion, Calibration, Fringe analysis, CCD cameras, Cameras, 3D metrology, Phase shifts, 3D image processing, Lenses

SPIE Journal Paper | 16 June 2014
OE Vol. 53 Issue 12
KEYWORDS: Precision measurement, Superconductors, Inspection, Assembly tolerances, Optical testing, Distance measurement, Optical engineering, Metrology, Lithium, Optical tracking

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top