Dr. Wende Liu
at National Institute of Metrology
SPIE Involvement:
Author
Area of Expertise:
optical metrology , ellipsometry , radiometry
Publications (21)

Proceedings Article | 30 April 2024 Paper
Proceedings Volume 13156, 131561I (2024) https://doi.org/10.1117/12.3019867
KEYWORDS: Solar cells, Computer simulations, Object detection, Electroluminescence, Defect detection

Proceedings Article | 30 April 2024 Paper
Proceedings Volume 13153, 131531K (2024) https://doi.org/10.1117/12.3020162
KEYWORDS: Sensors, Imaging systems, Image sensors, Cameras, Measurement uncertainty

Proceedings Article | 30 April 2024 Paper
Qi Zang, Shaozhe Cui, Weijie Wang, Tao Liang, Xiaolu Zhan, Wende Liu, Yingwei He, Zhengang Lu, Haiyong Gan
Proceedings Volume 13153, 1315318 (2024) https://doi.org/10.1117/12.3018684
KEYWORDS: Scanners, Beam steering, Laser frequency, Light sources and illumination, Servomechanisms, Beam controllers, Mirrors, Calibration, Galvanometers, Laser scanners

Proceedings Article | 21 December 2023 Paper
Wende Liu, Yadong Chen, Taotao Zhang, Zuo Chen, Haiyong Gan, Junchao Zhang, Chuan Cai, Limin Xiong
Proceedings Volume 12966, 129660L (2023) https://doi.org/10.1117/12.3005643
KEYWORDS: Object detection, Photovoltaics, Defect detection, Electroluminescence, Image resolution, Machine vision, Cameras

Proceedings Article | 9 October 2021 Poster + Paper
Proceedings Volume 11899, 118990Z (2021) https://doi.org/10.1117/12.2601281
KEYWORDS: Measurement devices, Optical testing, Metrology

Showing 5 of 21 publications
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