Mr. Werner Brockherde Profile

Werner Brockherde

Head of Business Unit at Fraunhofer IMS

SPIE Involvement:

Author

Proceedings Article | 31 January 2020 Paper

64x48 pixel backside illuminated SPAD detector array for LiDAR applications

Jennifer Ruskowski, Charles Thattil, Jan Drewes, Werner Brockherde

Proceedings Volume 11288, 1128805 (2020) https://doi.org/10.1117/12.2550634

KEYWORDS: Sensors, LIDAR, Readout integrated circuits, Semiconducting wafers, Pixel resolution, Electronics, Detector arrays, CMOS technology, CMOS sensors

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Proceedings Article | 31 January 2020 Paper

Laser event distribution and timing circuit design constraints in direct TOF LiDAR applications

Andre Buchner, Jan Haase, Jennifer Ruskowski, Werner Brockherde

Proceedings Volume 11288, 112882J (2020) https://doi.org/10.1117/12.2550631

KEYWORDS: Photons, LIDAR, Picosecond phenomena, Laser applications, Sensors, Semiconductor lasers, Pulsed laser operation, Time metrology, Laser sources, Single photon

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Proceedings Article | 1 February 2019 Presentation + Paper

Measurement concept for direct time-of-flight sensors at high ambient light

Jan Haase, Maik Beer, Olaf Schrey, Jennifer Ruskowski, Werner Brockherde, Holger Vogt

Proceedings Volume 10926, 109260W (2019) https://doi.org/10.1117/12.2509779

KEYWORDS: Optical filters, Bandpass filters, Reflectivity, Distance measurement, Sensors, LIDAR, Photodetectors, Light sources, Laser sources, Signal detection

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Proceedings Article | 26 January 2018 Presentation + Paper

SPAD-based flash LiDAR sensor with high ambient light rejection for automotive applications

Maik Beer, Olaf Schrey, Jan Haase, Jennifer Ruskowski, Werner Brockherde, Bedrich Hosticka, Rainer Kokozinski

Proceedings Volume 10540, 105402G (2018) https://doi.org/10.1117/12.2286879

KEYWORDS: Sensors, Photons, Clocks, Single photon, LIDAR, Time metrology, Signal detection, Distance measurement, Reflectivity, CMOS sensors

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Proceedings Article | 16 February 2017 Presentation + Paper

CMOS SiPM with integrated amplifier

Alexander Schwinger, Werner Brockherde, Bedrich Hosticka, Holger Vogt

Proceedings Volume 10100, 101001A (2017) https://doi.org/10.1117/12.2252516

KEYWORDS: Resistors, Sensors, Amplifiers, Capacitance, Electronics, Single photon detectors, Active sensors, Avalanche photodiodes, Silicon photomultipliers, Optoelectronics, Metals, Optical amplifiers, Measurement devices, Temperature metrology

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Proceedings Article | 22 June 2015 Paper

Ultrafast 2K line-scan sensor for industrial inspection applications

Christian Nitta, Benjamin Bechen, Ernst Bodenstorfer, Jörg Brodersen, Konrad Mayer, Werner Brockherde, Olaf Schrey

Proceedings Volume 9525, 95251V (2015) https://doi.org/10.1117/12.2184683

KEYWORDS: Sensors, Cadmium sulfide, Cameras, Inspection, Line scan image sensors, Image sensors, RGB color model, Synthetic aperture radar, Signal to noise ratio, Optical filters

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Proceedings Article | 28 May 2014 Paper

Low-noise CMOS SPAD arrays with in-pixel time-to-digital converters

Alberto Tosi, Federica Villa, Danilo Bronzi, Yu Zou, Rudi Lussana, Davide Tamborini, Simone Tisa, Daniel Durini, Sascha Weyers, Uwe Pashen, Werner Brockherde, Franco Zappa

Proceedings Volume 9114, 91140C (2014) https://doi.org/10.1117/12.2053415

KEYWORDS: Picosecond phenomena, Clocks, Cameras, Photodetectors, Ranging, Sensors, Imaging systems, Electronics, CMOS technology, Photon counting

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Proceedings Article | 15 May 2014 Paper

Performance analysis of a large photoactive area CMOS line sensor for fast, time-resolved spectroscopy applications

Elena Poklonskaya, Daniel Durini, Melanie Jung, Olaf Schrey, Adrian Driewer, Werner Brockherde, Bedrich Hosticka, Holger Vogt

Proceedings Volume 9141, 914103 (2014) https://doi.org/10.1117/12.2051318

KEYWORDS: Sensors, CMOS sensors, Electrons, CCD image sensors, Silicon, Diffusion, Charge-coupled devices, Doping, Metals, Green light emitting diodes

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Proceedings Article | 4 February 2013 Paper

Large-area CMOS SPADs with very low dark counting rate

D. Bronzi, F. Villa, S. Bellisai, S. Tisa, A. Tosi, G. Ripamonti, F. Zappa, S. Weyers, D. Durini, W. Brockherde, U. Paschen

Proceedings Volume 8631, 86311B (2013) https://doi.org/10.1117/12.2004209

KEYWORDS: CMOS technology, Photodetectors, Electronics, Sensors, Avalanche photodiodes, Quenching (fluorescence), Silicon, Quantum efficiency, CMOS sensors, Ranging

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Proceedings Article | 19 November 2012 Paper

SPAD imagers for remote sensing at the single-photon level

F. Villa, D. Bronzi, S. Bellisai, G. Boso, A. Bahgat Shehata, C. Scarcella, A. Tosi, F. Zappa, S. Tisa, D. Durini, S. Weyers, W. Brockherde

Proceedings Volume 8542, 85420G (2012) https://doi.org/10.1117/12.974532

KEYWORDS: Imaging systems, 3D image processing, Ranging, Picosecond phenomena, Sensors, Quenching (fluorescence), Photodetectors, Phase shift keying, Electronics, Modulation

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Proceedings Article | 24 October 2012 Paper

3D sensor for indirect ranging with pulsed laser source

D. Bronzi, S. Bellisai, F. Villa, C. Scarcella, A. Bahgat Shehata, A. Tosi, G. Padovini, F. Zappa, S. Tisa, D. Durini, S. Weyers, W. Brockherde

Proceedings Volume 8541, 85410T (2012) https://doi.org/10.1117/12.974504

KEYWORDS: Sensors, Pulsed laser operation, Signal detection, Ranging, Imaging systems, Photodetectors, 3D image processing, Modulation, Electronics, Laser sources

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Proceedings Article | 19 February 2004 Paper

Three-dimensional CMOS image sensor with 4x64 pixel array

Omar Elkhalili, Olaf Schrey, Ralf Jeremias, Peter Mengel, Martin Petermann, Werner Brockherde, Bedrich Hosticka

Proceedings Volume 5251, (2004) https://doi.org/10.1117/12.512930

KEYWORDS: Sensors, Camera shutters, Pulsed laser operation, Cadmium sulfide, Clocks, 3D image processing, Analog electronics, CMOS sensors, Imaging systems, Switches

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Proceedings Article | 19 February 2004 Paper

CMOS detector with combined in-situ demodulation and image acquisition

Ingo Hehemann, Werner Brockherde, Armin Kemna, Bedrich Hosticka

Proceedings Volume 5251, (2004) https://doi.org/10.1117/12.516537

KEYWORDS: Photodiodes, Sensors, Optical storage, Demodulation, Image acquisition, Signal detection, Integrated circuit design, Integrated circuits, Amplifiers, Readout integrated circuits

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Showing 5 of 13 publications

Conference Committee Involvement (1)

Detectors and Associated Signal Processing

1 October 2003 | St. Etienne, France

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