Dr. Werner P. O. Jüptner Profile

Dr. Werner P. O. Jüptner

Retired at

SPIE Involvement:

Board of Directors | European Advisory Committee | Fellows Committee | Symposia Committee | Fellow status | Conference Program Committee | Symposium Chair | Conference Chair | Track Chair | Author

Publications (118)

PROCEEDINGS ARTICLE | May 27, 2011

Industrial surface inspection by wavelet analysis

Proc. SPIE. 8082, Optical Measurement Systems for Industrial Inspection VII

KEYWORDS: Wavelet transforms, Data compression, Defect detection, Wavelets, Inspection, Fourier transforms, Linear filtering, Optical testing, Spectral resolution, Spatial resolution

PROCEEDINGS ARTICLE | August 21, 2009

Sub-nanometer resolution for the inspection of reflective surfaces using white light

Proc. SPIE. 7405, Instrumentation, Metrology, and Standards for Nanomanufacturing III

KEYWORDS: Mirrors, Phase shifting, Reflection, Imaging systems, Interferometers, Cameras, Image processing, Silicon, Reflectivity, Phase measurement

PROCEEDINGS ARTICLE | August 14, 2006

Optimized setup for active compensation of distortions for interferometric techniques onboard the International Space Station

Proc. SPIE. 6292, Interferometry XIII: Techniques and Analysis

KEYWORDS: Optical components, Refractive index, Beam splitters, Interferometers, Sensors, Interferometry, Wavefronts, CCD cameras, Charge-coupled devices, Temperature metrology

PROCEEDINGS ARTICLE | March 7, 2006

High-resolution measurement of extended technical surfaces with scalable topometry

Proc. SPIE. 4101, Laser Interferometry X: Techniques and Analysis

KEYWORDS: Sensors, Image segmentation, Ceramics, Inspection, Image resolution, Feature extraction, Image sensors, Fractal analysis, Shape analysis, Tolerancing

PROCEEDINGS ARTICLE | March 7, 2006

Particle analysis with digital holography

Proc. SPIE. 4101, Laser Interferometry X: Techniques and Analysis

KEYWORDS: Diffraction, Holograms, Holography, 3D image reconstruction, Digital holography, Particles, CCD cameras, Optical resolution, Optical simulations, Phase measurement

PROCEEDINGS ARTICLE | March 7, 2006

Indication of deformations on the surface of toroidal objects by an optoelectronic method

Proc. SPIE. 4101, Laser Interferometry X: Techniques and Analysis

KEYWORDS: Mirrors, Interferometers, Interferometry, Nondestructive evaluation, Optical testing, Semiconductor lasers, Head, Optoelectronics, Shearography, Michelson interferometers

PROCEEDINGS ARTICLE | March 7, 2006

Characterization of micro-optics using digital holography

Proc. SPIE. 4101, Laser Interferometry X: Techniques and Analysis

KEYWORDS: Holograms, 3D image reconstruction, Digital holography, Lenses, Fourier transforms, Interferometry, Wavefronts, CCD cameras, Micro optics, Microlens

PROCEEDINGS ARTICLE | March 7, 2006

Influence of unresolved speckles in interferometric phase measurements

Proc. SPIE. 4101, Laser Interferometry X: Techniques and Analysis

KEYWORDS: Phase shifting, Speckle, Cameras, Error analysis, Interferometry, Computer simulations, Objectives, Charge-coupled devices, Phase measurement, Phase shifts

PROCEEDINGS ARTICLE | March 7, 2006

Shearography system for the testing of large-scale aircraft components taking into account noncooperative surfaces

Proc. SPIE. 4101, Laser Interferometry X: Techniques and Analysis

KEYWORDS: Thermography, Speckle, Sensors, Inspection, Nondestructive evaluation, Control systems, Ultrasonics, Image quality, Shearography, Decision support systems

PROCEEDINGS ARTICLE | March 7, 2006

Detection and compensation of misalignment for interferometric diagnostic tools applied in space-borne facilities

Proc. SPIE. 4101, Laser Interferometry X: Techniques and Analysis

KEYWORDS: Optical components, Mirrors, Interferometers, Sensors, Error analysis, Diagnostics, Interferometry, Wavefronts, CCD cameras, Holographic interferometry

PROCEEDINGS ARTICLE | March 7, 2006

Combined 3D-shape and deformation analysis of small objects using coherent optical techniques on the basis of digital holography

Proc. SPIE. 4101, Laser Interferometry X: Techniques and Analysis

KEYWORDS: Holograms, Holography, Digital holography, Data modeling, Interferometry, Shape analysis, Charge-coupled devices, Reconstruction algorithms, Digital recording, Holographic interferometry

PROCEEDINGS ARTICLE | February 27, 2006

Impact measurements using double pulse digital holography

Proc. SPIE. 6136, Practical Holography XX: Materials and Applications

KEYWORDS: Carbon, Holograms, Holography, Digital holography, Composites, Wavefronts, Structured optical fibers, CCD cameras, Velocity measurements, Ruby lasers

PROCEEDINGS ARTICLE | December 10, 2005

Laser-induced generation of shaped holes by variable beam shaping

Proc. SPIE. 6157, Workshop on Laser Applications in Europe

KEYWORDS: Diffraction, Telescopes, Gaussian beams, Nd:YAG lasers, Laser beam propagation, Process control, Optical simulations, Beam shaping, Geometrical optics, Device simulation

PROCEEDINGS ARTICLE | November 17, 2005

Integrated quality assurance for assembly and testing of complex structures

Proc. SPIE. 5999, Intelligent Systems in Design and Manufacturing VI

KEYWORDS: Reflection, Imaging systems, Cameras, Manufacturing, Lamps, Inspection, Stereoscopic cameras, Distance measurement, Projection systems, Shearography

PROCEEDINGS ARTICLE | September 10, 2005

Compression of digital holographic data using its electromagnetic field properties

Proc. SPIE. 5908, Optical Information Systems III

KEYWORDS: Holograms, Holography, Data compression, Image compression, Digital holography, Speckle, Quantization, Optical simulations, Electromagnetism, Phase shifts

PROCEEDINGS ARTICLE | June 13, 2005

Characterisation of high-density particle distributions for optimisation of laser cladding processes using digital holography

Proc. SPIE. 5856, Optical Measurement Systems for Industrial Inspection IV

KEYWORDS: Holograms, Holography, 3D image reconstruction, Digital holography, Cladding, Particles, Laser processing, Wavefronts, CCD cameras, Particle image velocimetry

PROCEEDINGS ARTICLE | April 12, 2005

Mobile shearography

Proc. SPIE. 5852, Third International Conference on Experimental Mechanics and Third Conference of the Asian Committee on Experimental Mechanics

KEYWORDS: Speckle, Sensors, Inspection, Interferometry, Nondestructive evaluation, Head, Shearography, Optics manufacturing, Aircraft structures, Phase shifts

PROCEEDINGS ARTICLE | September 10, 2004

Application of comparative digital holography for distant shape control

Proc. SPIE. 5457, Optical Metrology in Production Engineering

KEYWORDS: Holograms, Holography, Digital holography, Calibration, Networks, Wavefronts, Optical testing, Spatial light modulators, Liquid crystal on silicon, Spherical lenses

PROCEEDINGS ARTICLE | September 10, 2004

Evaluation methods for gradient measurement techniques

Proc. SPIE. 5457, Optical Metrology in Production Engineering

KEYWORDS: Reflection, Sensors, Fourier transforms, Wavefront sensors, Feature extraction, Optical metrology, Data processing, 3D metrology, Shearography, Data integration

PROCEEDINGS ARTICLE | September 10, 2004

Digital holography used for measurement of deformations during gas quenching processes

Proc. SPIE. 5457, Optical Metrology in Production Engineering

KEYWORDS: Holograms, Holography, Digital holography, Nitrogen, Interferometry, Distortion, Process control, Holographic interferometry, Pulsed laser operation, Quenching (fluorescence)

PROCEEDINGS ARTICLE | September 10, 2004

Digital holography and grating interferometry: a complementary approach

Proc. SPIE. 5457, Optical Metrology in Production Engineering

KEYWORDS: Diffraction, Holograms, 3D image reconstruction, Digital holography, Cameras, Sensors, Polymers, Metals, Interferometry, Diffraction gratings

PROCEEDINGS ARTICLE | September 10, 2004

High-resolution 3D shape measurement on specular surfaces by fringe reflection

Proc. SPIE. 5457, Optical Metrology in Production Engineering

KEYWORDS: Mirrors, Reflection, Imaging systems, Cameras, Calibration, Particles, Error analysis, Inspection, Image resolution, 3D metrology

PROCEEDINGS ARTICLE | August 2, 2004

Active alignment for interferometric techniques onboard the International Space Station

Proc. SPIE. 5532, Interferometry XII: Applications

KEYWORDS: Optical components, Interferometers, Sensors, Error analysis, Interferometry, Wavefronts, CCD cameras, Holographic interferometry, Environmental sensing, Temperature metrology

Different interferometric techniques are required to cover most of the scientific needs in the field of fluid dynamics science in microgravity research. The Fluid Science Laboratory (FSL), currently under upgrade for the Columbus Orbital Facility of the International Space Station (ISS), shall provide Holographic Interferometry, Digital Holography, Electronic Speckle Pattern Interferometry (ESPI) and Shearing Interferometry among other diagnostic tools. On earth, these highly sensitive interferometers are operated in a thermal and mechanical controlled environment. In opposition to the situation on ground the multi-user facility of the FSL has severe constraints for what concerns volume, mass, modularity, operational needs and its environment. This results in a three-dimensional modular drawer structure for the design of the optical-mechanical set-up, where performance limitations must be expected compared to systems on ground. In a rather uncontrolled thermal environment onboard the ISS this leads to misalignment due to thermo-mechanical changes of the Aluminum structure during experiment runs which finally result in interferogram distortions and therefore to significant measurement errors. In this paper we report about a misalignment detection- and active compensation concept developed on the basis of a thermo-mechanical and optical analysis of the set-up. The detection system is based on a simplified Hartmann-Sensor. It is able to separate wave front tilt and curvature errors due to misalignments of the interferometers itself from the effects caused by the experiment. The closed-loop compensation system uses optical components of the set-up driven by piezoelectric actuators. Due to its active approach this concept allows for the real time accessibility of the experimental effects in the framework of “Telescience.” Extensive functional tests as well as representative thermal tests show the suitability of the proposed technique to compensate interferogram distortions due to thermal-mechanical deformations. Thus, it is able to ensure interferometric measurements with sub-wavelength accuracy onboard the ISS.

PROCEEDINGS ARTICLE | August 2, 2004

Setup calibration and optimization for comparative digital holography

Proc. SPIE. 5532, Interferometry XII: Applications

KEYWORDS: Holograms, Holography, 3D image reconstruction, Digital holography, Calibration, Interferometry, Wavefronts, Spatial light modulators, LCDs, Phase shifts

With increasing globalization many enterprises decide to produce the components of their products at different locations all over the world. Consequently, new technologies and strategies for quality control are required. In this context the remote comparison of objects with regard to their shape or response on certain loads is getting more and more important for a variety of applications. For such a task the novel method of comparative digital holography is a suitable tool with interferometric sensitivity. With this technique the comparison in shape or deformation of two objects does not require the presence of both objects at the same place. In contrast to the well known incoherent techniques based on inverse fringe projection this new approach uses a coherent mask for the illumination of the sample object. The coherent mask is created by digital holography to enable the instant access to the complete optical information of the master object at any wanted place. The reconstruction of the mask is done by a spatial light modulator (SLM). The transmission of the digital master hologram to the place of comparison can be done via digital telecommunication networks. Contrary to other interferometric techniques this method enables the comparison of objects with different microstructure. In continuation of earlier reports our investigations are focused here on the analysis of the constraints of the setup with respect to the quality of the hologram reconstruction with a spatial light modulator. For successful measurements the selection of the appropriate reconstruction method and the adequate optical set-up is mandatory. In addition, the use of a SLM for the reconstruction requires the knowledge of its properties for the accomplishment of this method. The investigation results for the display properties such as display curvature, phase shift and the consequences for the technique will be presented. The optimization and the calibration of the set-up and its components lead to improved results in comparative digital holography with respect to the resolution. Examples of measurements before and after the optimization and calibration will be presented.

SPIE Journal Paper | February 1, 2004

Accurate procedure for the calibration of a structured light system

Legarda-Sáenz, Ricardo , Bothe, Thorsten , Jüptner, Werner

OE Vol. 43 Issue 02

KEYWORDS: Calibration, Laser sintering, Projection systems, Cameras, 3D modeling, Error analysis, Mathematical modeling, Instrument modeling, 3D acquisition, Structured light

PROCEEDINGS ARTICLE | October 3, 2003

Miniaturized sensor head for distal holographic endoscopy

Proc. SPIE. 5145, Microsystems Engineering: Metrology and Inspection III

KEYWORDS: Endoscopy, Optical fibers, Beam splitters, Switches, Digital holography, Sensors, Endoscopes, Semiconductor lasers, CCD cameras, Head

PROCEEDINGS ARTICLE | May 30, 2003

Applications of inverse pattern projection

Proc. SPIE. 5144, Optical Measurement Systems for Industrial Inspection III

KEYWORDS: Phase shifting, Modulation, Cameras, Image processing, Inspection, Phase shift keying, Augmented reality, 3D metrology, Projection systems, Phase measurement

Fast and robust 3D quality control as well as fast deformation measurement is of particular importance for industrial inspection. Additionally a direct response about measured properties is desired. Therefore, robust optical techniques are needed which use as few images as possible for measurement and visualize results in an efficient way. One promising technique for this aim is the inverse pattern projection which has the following advantages: The technique codes the information of a preceding measurement into the projected inverse pattern. Thus, it is possible to do differential measurements using only one camera frame for each state. Additionally, the results are optimized straight fringes for sampling which are independent of the object curvature. The hardware needs are low as just a programmable projector and a standard camera are necessary. The basic idea of inverse pattern projection, necessary algorithms and found optimizations are demonstrated, roughly. Evaluation techniques were found to preserve a high quality phase measurement under imperfect conditions. The different application fields can be sorted out by the type of pattern used for inverse projection. We select two main topics for presentation. One is the incremental (one image per state) deformation measurement which is a promising technique for high speed deformation measurements. A video series of a wavering flag with projected inverse pattern was evaluated to show the complete deformation series. The other application is the optical feature marking (augmented reality) that allows to map any measured result directly onto the object under investigation. Any properties can be visualized directly on the object’s surface which makes inspections easier than with use of a separated indicating device. The general ability to straighten any kind of information on 3D surfaces is shown while preserving an exact mapping of camera image and object parts. In many cases this supersedes an additional monitor to view results and allows an operator to investigate results on the object, directly.

PROCEEDINGS ARTICLE | May 30, 2003

Three-dimensional camera

Proc. SPIE. 5144, Optical Measurement Systems for Industrial Inspection III

KEYWORDS: Imaging systems, Cameras, Calibration, 3D modeling, LCDs, Stereoscopic cameras, Distance measurement, 3D metrology, Projection systems, Phase measurement

Industrial- and multimedia applications need cost effective, compact and flexible 3D profiling instruments. In the talk we will show the principle of, applications for and results from a new miniaturized 3-D profiling system for macroscopic scenes. The system uses a compact housing and is usable like a camera with minimum stabilization like a tripod. The system is based on common fringe projection technique. Camera and projector are assembled with parallel optical axes having coplanar projection and imaging plane. Their axes distance is comparable to the human eyes distance altogether giving a complete system of 21x20x11 cm size and allowing to measure high gradient objects like the interior of tubes. The fringe projector uses a LCD which enables fast and flexible pattern projection. Camera and projector have a short focal length and a high system aperture as well as a large depth of focus. Thus, objects can be measured from a shorter distance compared to common systems (e.g. 1 m sized objects in 80 cm distance). Actually, objects with diameters up to 4 m can be profiled because the set-up allows working with completely opened aperture combined with bright lamps giving a big amount of available light and a high Signal to Noise Ratio. Normally a small basis has the disadvantage of reduced sensitivity. We investigated in methods to compensate the reduced sensitivity via setup and enhanced evaluation methods. For measurement we use synthetic wavelengths. The developed algorithms are completely adaptable concerning the users needs of speed and accuracy. The 3D camera is built from low cost components, robust, nearly handheld and delivers insights also into difficult technical objects like tubes and inside volumes. Besides the realized high resolution phase measurement the system calibration is an important task for usability. While calibrating with common photogrammetric models (which are typically used for actual fringe projection systems) problems were found that originate from the short focal length and the extreme opening angle of the system as well as the large depth of focus. The actual calibration method is outlined and current problems are shown. An improved calibration of the system is discussed for improved results in future.

PROCEEDINGS ARTICLE | May 27, 2003

Object-adapted inverse pattern projection: generation, evaluation, and applications

Proc. SPIE. 4933, Speckle Metrology 2003

KEYWORDS: Modulation, Visualization, Cameras, Image processing, Video, Inspection, Augmented reality, 3D metrology, Projection systems, Phase measurement

Fast and robust 3D quality control as well as fast deformation measurement is of particular importance for industrial inspection. Additionally a direct response about measured properties is desired. Therefore, robust optical techniques are needed which use as few images as possible for measurement and visualize results in an efficient way. One promising technique for this aim is the inverse pattern projection which has the following advantages: The technique codes the information of a preceding measurement into the projected inverse pattern. Thus, it is possible to do differential measurements using only one camera frame for each state. Additionally, the results are optimized straight fringes for sampling which are independent of the object curvature. The ability to use any image for inverse projection enables the use for augmented reality, i.e. any properties can be visualized directly on the object's surface which makes inspections easier than with use of a separated indicating device. The hardware needs are low as just a programmable projector and a standard camera are necessary. The basic idea of inverse pattern projection, necessary algorithms ane found optimizations are demonstrated, roughly. Evaluation techniques were found to preserve a high quality phase measurement under imperfect conditions. The different application fields can be sorted out by the type of pattern used for inverse projection. We select two main topics for presentation. One is the incremental (one image per state) deformation measurement which is a promising technique for high speed deformation measurements. A video series of a wavering flag with projected inverse pattern was evaluated to show the complete deformation series. The other application is the optical feature marking (augmented reality) that allows to map any measured result directly onto the object under investigation. The general ability to straighten any kind of information on 3D surfaces is shown while preserving an exact mapping of camera image and object parts. In many cases this supersedes an additional monitor to view results and allows an operator to investigate results on the object, directly.

PROCEEDINGS ARTICLE | May 27, 2003

Fringe compensation in multiband speckle shearography using a wedge prism

Proc. SPIE. 4933, Speckle Metrology 2003

KEYWORDS: Diffraction, Refractive index, Prisms, Light sources, Modulation, Speckle, Mercury, Lamps, Shearography, Shearing interferometers

PROCEEDINGS ARTICLE | May 27, 2003

Improvement of interferometric phase measurements by consideration of the speckle field topology

Proc. SPIE. 4933, Speckle Metrology 2003

KEYWORDS: Modulation, Speckle, Sensors, Error analysis, Image resolution, Interferometry, Phase shift keying, Phase interferometry, CCD cameras, Phase measurement

PROCEEDINGS ARTICLE | September 12, 2002

Advanced shearographic system for nondestructive testing of industrial and artwork components

Proc. SPIE. 4915, Lasers in Material Processing and Manufacturing

KEYWORDS: Laser sources, Speckle, Sensors, Image processing, Inspection, Nondestructive evaluation, CCD cameras, Head, Image sensors, Shearography

PROCEEDINGS ARTICLE | July 29, 2002

Features of multiband speckle shearography

Proc. SPIE. 4900, Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life

KEYWORDS: Temporal coherence, Light sources, Modulation, Speckle, Mercury, Lamps, Interferometry, Spatial coherence, Shearography, Michelson interferometers

PROCEEDINGS ARTICLE | July 29, 2002

Progress with the implementation of a shearography system for the testing of technical components

Proc. SPIE. 4900, Seventh International Symposium on Laser Metrology Applied to Science, Industry, and Everyday Life

KEYWORDS: Light sources, Speckle, Sensors, Inspection, Nondestructive evaluation, Image sensors, Infrared radiation, Charge-coupled devices, Shearography, Decision support systems

PROCEEDINGS ARTICLE | June 20, 2002

Aperture synthesis in digital holography

Proc. SPIE. 4777, Interferometry XI: Techniques and Analysis

KEYWORDS: Point spread functions, Digital holography, Speckle, Interferometry, CCD cameras, Synthetic apertures, Charge-coupled devices

PROCEEDINGS ARTICLE | June 19, 2002

Characterization of aspherical micro-optics using digital holography: improvement of accuracy

Proc. SPIE. 4778, Interferometry XI: Applications

KEYWORDS: Holograms, 3D image reconstruction, Digital holography, Speckle, Digital filtering, Wavefronts, CCD cameras, Speckle pattern, Microlens, Image filtering

PROCEEDINGS ARTICLE | June 19, 2002

Remote interferometry by digital holography for shape control

Proc. SPIE. 4778, Interferometry XI: Applications

KEYWORDS: Holograms, Holography, 3D image reconstruction, Digital holography, Inspection, Interferometry, Wavefronts, Modulators, CCD cameras, LCDs

Modern production requires more and more effective methods for the inspection and quality control at the production place. Outsourcing and globalization result in possible large distances between co-operating partners. This may cause serious problems with respect to the just-in-time exchange of information and the response to possible violations of quality standards. Consequently new challenges arise for optical measurement techniques especially in the field of industrial shape control. A possible solution for these problems can be delivered by a technique that stores optically the full 3D information of the objects to be compared and where the data can be transported over large distances. In this paper we describe the progress in implementing a new technique for the direct comparison of the shape and deformation of two objects with different microstructure where it is not necessary that both samples are located at the same place. This is done by creating a coherent mask for the illumination of the sample object. The coherent mask is created by Digital Holography to enable the instant access to the complete optical information of the master object at any wanted place. The transmission of the digital master holograms to this place can be done via digital telecommunication networks. The comparison can be done in a digital or analogue way. Both methods result in a disappearance of the object shape and the appearance of the shape or deformation difference between the two objects only. The analogue reconstruction of the holograms with a liquid crystal spatial light modulator can be done by using the light modulator as an intensity modulator or as an phase modulator. The reconstruction technique and the space bandwidth of the light modulator will influence the quality of the result. Therefore the paper describes the progress in applying modern spatial light modulators and digital cameras for the effective storage and optical reconstruction of coherent masks.

PROCEEDINGS ARTICLE | June 19, 2002

Compact 3D camera

Proc. SPIE. 4778, Interferometry XI: Applications

KEYWORDS: Cameras, Lamps, Polarizers, CCD cameras, LCDs, Stereoscopic cameras, Projection systems, Objectives, Charge-coupled devices, Phase measurement

PROCEEDINGS ARTICLE | May 29, 2002

Deformation and 3D-shape measurement system based on phase-shifting digital holography

Proc. SPIE. 4537, Third International Conference on Experimental Mechanics

KEYWORDS: Endoscopy, Beam splitters, Holograms, Holography, 3D image reconstruction, Digital holography, Sensors, Computing systems, CCD image sensors, Phase shifts

PROCEEDINGS ARTICLE | December 27, 2001

New approach for testing of aspherical micro-optics with high numerical aperture

Proc. SPIE. 4451, Optical Manufacturing and Testing IV

KEYWORDS: Diffraction, Holograms, Holography, 3D image reconstruction, Digital holography, Image processing, Interferometry, Wavefronts, CCD cameras, Microlens

PROCEEDINGS ARTICLE | October 30, 2001

New sensor for remote interferometry

Proc. SPIE. 4596, Advanced Photonic Sensors and Applications II

KEYWORDS: Internet, Holograms, Holography, 3D image reconstruction, Digital holography, Sensors, Inspection, Interferometry, Wavefronts, Holographic interferometry

PROCEEDINGS ARTICLE | October 30, 2001

Active industrial surface inspection with the inverse projected-fringe technique

Proc. SPIE. 4596, Advanced Photonic Sensors and Applications II

KEYWORDS: Fringe analysis, Inspection, Modulators, CCD cameras, Spatial light modulators, LCDs, Projection systems, Liquid crystals, Phase measurement, Optically addressed spatial light modulators

PROCEEDINGS ARTICLE | October 23, 2001

Features of the subjective speckle field and their use for noise-immune unwrapping

Proc. SPIE. 4398, Optical Measurement Systems for Industrial Inspection II: Application in Industrial Design

KEYWORDS: Coherence imaging, Speckle, Interferometry, Numerical simulations, Computer simulations, Objectives, Phase measurement, Holographic interferometry, Virtual reality, Line scan image sensors

PROCEEDINGS ARTICLE | October 23, 2001

Influence of depolarization effects in interferometric measurement methods

Proc. SPIE. 4398, Optical Measurement Systems for Industrial Inspection II: Application in Industrial Design

KEYWORDS: Modulation, Polarization, Speckle, Scattering, Light scattering, Laser scattering, Interferometry, Aluminum, Electromagnetism, Electromagnetic scattering

SPIE Conference Volume | October 23, 2001

Optical Measurement Systems for Industrial Inspection II: Application in Industrial Design

PROCEEDINGS ARTICLE | October 23, 2001

Application of digital holography for the inspection of microcomponents

Proc. SPIE. 4400, Microsystems Engineering: Metrology and Inspection

KEYWORDS: Holograms, Holography, Microsystems, Digital holography, Data modeling, Inspection, Phase shift keying, Phase measurement, Holographic interferometry, Thermal modeling

SPIE Conference Volume | October 23, 2001

Microsystems Engineering: Metrology and Inspection

PROCEEDINGS ARTICLE | October 23, 2001

Application of digital holographic microscopy for inspection of micro-optical components

Proc. SPIE. 4398, Optical Measurement Systems for Industrial Inspection II: Application in Industrial Design

KEYWORDS: Holograms, Holography, 3D image reconstruction, Digital holography, Microscopy, Inspection, Interferometry, Wavefronts, CCD cameras, Microlens

SPIE Conference Volume | October 3, 2001

Optical Measurement Systems for Industrial Inspection II: Applications in Production Engineering

PROCEEDINGS ARTICLE | September 11, 2001

Material testing of laser welds and claddings using digital speckle photography

Proc. SPIE. 4420, Laser Metrology for Precision Measurement and Inspection in Industry

PROCEEDINGS ARTICLE | June 13, 2001

Inverse projected fringe technique

Proc. SPIE. 4317, Second International Conference on Experimental Mechanics

KEYWORDS: Fringe analysis, Cameras, Inspection, Optical testing, Spatial light modulators, Liquid crystals, Phase measurement, Optically addressed spatial light modulators, Active optics, Statistical modeling

PROCEEDINGS ARTICLE | June 5, 2001

Absolute shape control of microcomponents using digital holography and multiwavelength contouring

Proc. SPIE. 4275, Metrology-based Control for Micro-Manufacturing

KEYWORDS: Holograms, Holography, 3D image reconstruction, Digital holography, Sensors, Calibration, Inspection, Interferometry, Demodulation, Resistors

PROCEEDINGS ARTICLE | September 29, 2000

Determination of geometric properties of SNOM tips by means of far-field evaluation

Proc. SPIE. 4098, Optical Devices and Diagnostics in Materials Science

KEYWORDS: Microscopes, Diffraction, Mirrors, Glasses, Near field scanning optical microscopy, Near field, Wave propagation, Charge-coupled devices, Inverse optics, Near field optics

SPIE Conference Volume | July 7, 2000

Laser Interferometry X: Techniques and Analysis

PROCEEDINGS ARTICLE | November 11, 1999

New light sources and sensors for active optical 3D inspection

Proc. SPIE. 3897, Advanced Photonic Sensors and Applications

KEYWORDS: Mirrors, Light sources, Sensors, Image processing, Near field scanning optical microscopy, LCDs, Liquid crystals, Digital micromirror devices, Vertical cavity surface emitting lasers, Optically addressed spatial light modulators

PROCEEDINGS ARTICLE | September 21, 1999

NDT on wide-scale aircraft structures with digital speckle shearography

Proc. SPIE. 3824, Optical Measurement Systems for Industrial Inspection

KEYWORDS: Visualization, Speckle, Image processing, Inspection, Nondestructive evaluation, CCD cameras, Software development, Shearography, Testing and analysis, Aircraft structures

PROCEEDINGS ARTICLE | September 21, 1999

Application of digital speckle photography for local strain analysis

Proc. SPIE. 3824, Optical Measurement Systems for Industrial Inspection

KEYWORDS: Digital signal processing, Digital photography, Speckle, Cladding, Metals, Photography, Laser processing, Optical testing, Speckle pattern, Strain analysis

PROCEEDINGS ARTICLE | September 21, 1999

Optical inspection of large-scale technical components

Proc. SPIE. 3824, Optical Measurement Systems for Industrial Inspection

KEYWORDS: Mirrors, Holography, Sensors, Inspection, Nondestructive evaluation, Optical inspection, Mining, Bridges, Shearography, Holographic interferometry

PROCEEDINGS ARTICLE | September 15, 1999

Qualification of optical measurement techniques for the investigation of material parameters of microcomponents

Proc. SPIE. 3825, Microsystems Metrology and Inspection

KEYWORDS: Fringe analysis, Holograms, Holography, Digital holography, Speckle, Sensors, Silicon, Inspection, Nondestructive evaluation, Holographic interferometry

PROCEEDINGS ARTICLE | September 9, 1999

Particle measurement with digital holography

Proc. SPIE. 3823, Laser Metrology and Inspection

KEYWORDS: Diffraction, Holograms, Holography, 3D image reconstruction, Digital holography, Particles, CCD cameras, Tomography, Convolution, Particle diagnostics

PROCEEDINGS ARTICLE | August 17, 1999

Some ways to improve the recognition of imperfections in large-scale components using shearography

Proc. SPIE. 3745, Interferometry '99: Applications

SPIE Conference Volume | August 17, 1999

Interferometry '99: Applications

PROCEEDINGS ARTICLE | August 13, 1999

Digital in-line holography in particle measurement

Proc. SPIE. 3744, Interferometry '99: Techniques and Technologies

PROCEEDINGS ARTICLE | August 13, 1999

Influence of phase singularities on the interferometric measurement of out-of-plane displacements

Proc. SPIE. 3744, Interferometry '99: Techniques and Technologies

PROCEEDINGS ARTICLE | June 9, 1999

TPS health monitoring on X-38

Proc. SPIE. 3668, Smart Structures and Materials 1999: Smart Structures and Integrated Systems

KEYWORDS: Nose, Safety, Sensors, Reliability, Inspection, Diagnostics, Data processing, Acoustic emission, Failure analysis, Sensor technology

PROCEEDINGS ARTICLE | May 7, 1999

Determination of geometric properties of SNOM tips by means of combined far-field and near-field evaluation

Proc. SPIE. 3740, Optical Engineering for Sensing and Nanotechnology (ICOSN '99)

KEYWORDS: Mathematical modeling, Microscopes, Diffraction, Mirrors, Glasses, Near field scanning optical microscopy, Near field, Objectives, Charge-coupled devices, Near field optics

PROCEEDINGS ARTICLE | September 29, 1998

Combined measurement of silicon microbeams by grating interferometry and digital holography

Proc. SPIE. 3407, International Conference on Applied Optical Metrology

KEYWORDS: Holography, Digital holography, Interferometers, Silicon, Interferometry, Photoresist materials, Finite element methods, Holographic interferometry, Semiconducting wafers, Diffraction gratings

PROCEEDINGS ARTICLE | September 29, 1998

Digital holography: methods and applications

Proc. SPIE. 3407, International Conference on Applied Optical Metrology

KEYWORDS: Holograms, Holography, Radon, 3D image reconstruction, Digital holography, Digital filtering, Particles, Fourier transforms, Charge-coupled devices, Convolution

PROCEEDINGS ARTICLE | September 29, 1998

Experimental and numerical analysis of the thermal deformation of composite tubes

Proc. SPIE. 3407, International Conference on Applied Optical Metrology

KEYWORDS: Modeling, Holography, Composites, Interferometry, 3D modeling, Numerical analysis, Speckle interferometry, Finite element methods, Holographic interferometry, Thermal modeling

PROCEEDINGS ARTICLE | September 29, 1998

Holography for the investigation of technical systems

Proc. SPIE. 3407, International Conference on Applied Optical Metrology

KEYWORDS: Holograms, Holography, Digital holography, Mechanics, Interferometry, Nondestructive evaluation, Control systems, Optical metrology, Neural networks, Holographic interferometry

PROCEEDINGS ARTICLE | September 29, 1998

Inverse projected-fringe technique with automatic pattern adaption using a programmable spatial light modulator

Proc. SPIE. 3407, International Conference on Applied Optical Metrology

KEYWORDS: Optical filters, Fringe analysis, Cameras, Inspection, 3D modeling, Optical testing, Spatial light modulators, Liquid crystals, Phase measurement, Optical correlators

SPIE Conference Volume | July 6, 1998

Laser Interferometry IX: Applications

PROCEEDINGS ARTICLE | July 6, 1998

Automatic flaw detection using recognition by synthesis: practical results

Proc. SPIE. 3479, Laser Interferometry IX: Applications

KEYWORDS: Fringe analysis, Satellites, Inspection, Nondestructive evaluation, Inverse problems, Domes, Finite element methods, Holographic interferometry, Spherical lenses, Device simulation

PROCEEDINGS ARTICLE | July 6, 1998

Simulation and experiment on the thermal deformation of composite tubes

Proc. SPIE. 3479, Laser Interferometry IX: Applications

KEYWORDS: Modeling, Holography, Composites, Interferometry, 3D modeling, Speckle pattern, Speckle interferometry, Finite element methods, Optical simulations, Holographic interferometry

PROCEEDINGS ARTICLE | July 6, 1998

Measuring shape and deformation of small objects using digital holography

Proc. SPIE. 3479, Laser Interferometry IX: Applications

KEYWORDS: Holograms, Holography, Digital holography, Cameras, Silicon, Wavefronts, Finite element methods, Shape analysis, Charge-coupled devices, Holographic interferometry

PROCEEDINGS ARTICLE | June 30, 1998

Principles of digital holographic interferometry

Proc. SPIE. 3478, Laser Interferometry IX: Techniques and Analysis

KEYWORDS: Diffraction, Holograms, 3D image reconstruction, Digital holography, Digital filtering, Fourier transforms, Charge-coupled devices, Convolution, Digital recording, Holographic interferometry

PROCEEDINGS ARTICLE | June 30, 1998

Investigation of laser welds by means of digital speckle photography

Proc. SPIE. 3478, Laser Interferometry IX: Techniques and Analysis

KEYWORDS: Digital signal processing, Digital photography, Speckle, Photography, Nd:YAG lasers, Optical testing, Speckle pattern, Failure analysis, Strain analysis, Correlation function

PROCEEDINGS ARTICLE | September 25, 1997

Automatic adaption of projected fringe patterns using a programmable LCD-projector

Proc. SPIE. 3100, Sensors, Sensor Systems, and Sensor Data Processing

KEYWORDS: Fringe analysis, Reflection, Image segmentation, Modulators, Computer programming, Spatial light modulators, LCDs, Signal processing, Projection systems, Reverse engineering

PROCEEDINGS ARTICLE | September 17, 1997

3D-deformation analysis of microcomponents using digital holography

Proc. SPIE. 3098, Optical Inspection and Micromeasurements II

KEYWORDS: Optical components, Holograms, Holography, Digital holography, Cameras, Magnetism, Wavefronts, Speckle pattern, Charge-coupled devices, Holographic interferometry

PROCEEDINGS ARTICLE | September 17, 1997

Methods of digital holography: a comparison

Proc. SPIE. 3098, Optical Inspection and Micromeasurements II

KEYWORDS: Diffraction, Holograms, Holography, 3D image reconstruction, Digital holography, Fourier transforms, CCD cameras, Convolution, Digital recording, Holographic interferometry

PROCEEDINGS ARTICLE | September 17, 1997

Particle size and position measurement with digital holography

Proc. SPIE. 3098, Optical Inspection and Micromeasurements II

KEYWORDS: Diffraction, Mirrors, Holograms, 3D image reconstruction, Digital holography, Particles, Image resolution, CCD cameras, Tomography, Convolution

SPIE Journal Paper | August 1, 1997

Suppression of the dc term in digital holography

Kreis, Thomas , Jueptner, Werner

OE Vol. 36 Issue 08

KEYWORDS: Optical fibers, Segmented mirrors, Digital holography, Holograms, Wavefronts, 3D image reconstruction, Holography, Temperature metrology, Optical testing, Gamma radiation

PROCEEDINGS ARTICLE | July 7, 1997

General approach for the description of optical 3D measuring systems

Proc. SPIE. 3174, Videometrics V

KEYWORDS: Calibration, 3D modeling, 3D metrology, Geometrical optics, Holographic interferometry, Systems modeling

PROCEEDINGS ARTICLE | April 4, 1997

Calculation of coupling losses for coaxial waveguide modes

Proc. SPIE. 3092, XI International Symposium on Gas Flow and Chemical Lasers and High-Power Laser Conference

KEYWORDS: Mirrors, Resonators, Waveguides, Fourier transforms, Free space, Wave propagation, Convolution, Waveguide modes, Waveguide lasers, Radio propagation

PROCEEDINGS ARTICLE | September 18, 1996

Combination of optically measured coordinates and displacements for quantitative investigation of complex objects

Proc. SPIE. 2782, Optical Inspection and Micromeasurements

KEYWORDS: Data modeling, Visualization, Interferometry, Clouds, 3D modeling, Optical testing, Data acquisition, Precision measurement, Laser interferometry, Holographic interferometry

Holographic interferometry makes it possible to measure high precision displacement data in the range of the wavelength of the used laser light. However, the determination of 3D- displacement vectors of objects with complex surfaces requires the measurement of 3D-object coordinates not only to consider local sensitivities but to distinguish between in-plane deformation, i.e. strains, and out-of-plane components, i.e. shears, too. To this purpose both the surface displacement and coordinates have to be combined and it is advantageous to make the data available for CAE- systems. The object surface has to be approximated analytically from the measured point cloud to generate a surface mesh. The displacement vectors can be assigned to the nodes of this surface mesh for visualization of the deformation of the object under test. They also can be compared to the results of FEM-calculations or can be used as boundary conditions for further numerical investigations. Here the 3D-object coordinates are measured in a separate topometric set-up using a modified fringe projection technique to acquire absolute phase values and a sophisticated geometrical model to map these phase data onto coordinates precisely. The determination of 3D-displacement vectors requires the measurement of several interference phase distributions for at least three independent sensitivity directions depending on the observation and illumination directions as well as the 3D-position of each measuring point. These geometric quantities have to be transformed into a reference coordinate system of the interferometric set-up in order to calculate the geometric matrix. The necessary transformation can be realized by means of a detection of object features in both data sets and a subsequent determination of the external camera orientation. This paper presents a consistent solution for the measurement and combination of shape and displacement data including their transformation into simulation systems. The described procedure will be demonstrated on an automotive component. Thus more accurate and effective measurement techniques make it possible to bring experimental and numerical displacement analysis closer.

PROCEEDINGS ARTICLE | July 19, 1996

Nondestructive quantitative 3D characterization of a car brake

Proc. SPIE. 2861, Laser Interferometry VIII: Applications

KEYWORDS: Data modeling, Imaging systems, Cameras, Calibration, Interferometry, Nondestructive evaluation, 3D modeling, 3D metrology, Phase measurement, Holographic interferometry

Holographic interferometry enables the accurate measurement of 3D displacement fields. However, the determination of 3D- displacement vectors of objects with complex surfaces requires to measure the 3D-object coordinates not only to consider local sensitivities but to distinguish between in- plane deformation, i.e. strains, and out-of-plane components, i.e. shears, too. To this purpose both the surface displacement and coordinates have to be combined and it is advantageous to make the data available for CAE- systems. The object surface has to be approximated analytically from the measured point cloud to generate a surface mesh. The displacement vectors can be assigned to the nodes of this surface mesh and the components of the deformation can be evaluated for an experimental stress analysis. They also can be compared to the results of FEM- calculations. The brake saddle of a car brake is such a complex formed object where the surface cannot be described by fundamental mathematical functions. The 3D-object coordinates were measured in a separate topometric set-up using a modified fringe projection technique to acquire absolute phase values. By means of a geometrical model the phase data were mapped onto coordinates precisely. The determination of 3D-displacement vectors required the measurement of several interference phase distributions for at least three independent sensitivity directions as well as the 3D-position of each measuring point. These geometric quantities had to be transformed into a reference coordinate system of the interferometric set-up in order to calculate the geometric matrix. The necessary transformation were realized by means of a detection of object features in both data sets and a subsequent determination of the external camera orientation. This paper presents a consistent solution for the measurement and combination of shape and displacement data including their transformation into simulation systems for the car brake. This is an example, how more accurate and effective measurement techniques make it possible to bring experimental and numerical displacement analysis closer.

PROCEEDINGS ARTICLE | July 19, 1996

Recognition by synthesis: a new approach for the recognition of material faults in HNDE

Proc. SPIE. 2861, Laser Interferometry VIII: Applications

KEYWORDS: Fringe analysis, Pattern recognition, Nondestructive evaluation, Distortion, Computer simulations, Finite element methods, Neural networks, Image classification, Holographic interferometry, Spherical lenses

SPIE Conference Volume | July 19, 1996

Laser Interferometry VIII: Applications

PROCEEDINGS ARTICLE | July 17, 1996

Light-in-flight measurements by digital holography

Proc. SPIE. 2860, Laser Interferometry VIII: Techniques and Analysis

KEYWORDS: Holograms, Holography, 3D image reconstruction, Digital holography, Spatial frequencies, Wavefronts, Wave plates, Laser induced fluorescence, Charge-coupled devices, CCD image sensors

SPIE Journal Paper | April 1, 1996

Digital recording and numerical reconstruction of holograms: reduction of the spatial frequency spectrum

Schnars, Ulf , Kreis, Thomas , Jueptner, Werner

OE Vol. 35 Issue 04

KEYWORDS: Holograms, Digital holography, Charge-coupled devices, Spatial frequencies, Holography, Digital recording, Holographic interferometry, Spatial resolution, Interferometry, Optical engineering

PROCEEDINGS ARTICLE | November 10, 1995

Modern approaches for absolute phase measurement

Proc. SPIE. 2647, International Conference on Holography and Correlation Optics

KEYWORDS: Moire patterns, Fringe analysis, Sensors, Control systems, Demodulation, Optical testing, Solids, Phase measurement, Algorithm development, Tolerancing

SPIE Conference Volume | June 23, 1995

Interferometry VII: Applications

PROCEEDINGS ARTICLE | June 23, 1995

Digital recording and numerical reconstruction of holograms for nondestructive testing

Proc. SPIE. 2545, Interferometry VII: Applications

KEYWORDS: Holograms, Holography, Digital holography, Satellites, Photography, Nondestructive evaluation, CCD cameras, Numerical analysis, Digital recording, Holographic interferometry

PROCEEDINGS ARTICLE | June 14, 1995

Evaluation of holographic interference patterns by artificial neural networks

Proc. SPIE. 2544, Interferometry VII: Techniques and Analysis

KEYWORDS: Holography, Defect detection, Computing systems, Demodulation, Computer simulations, Artificial neural networks, Neural networks, Holographic interferometry, Brain mapping, Neurons

PROCEEDINGS ARTICLE | June 14, 1995

CCD recording and numerical reconstruction of holograms and holographic interferograms

Proc. SPIE. 2544, Interferometry VII: Techniques and Analysis

KEYWORDS: Holograms, Holography, Digital image processing, 3D image reconstruction, Digital holography, Spatial frequencies, CCD cameras, Charge-coupled devices, Spatial resolution, Holographic interferometry

PROCEEDINGS ARTICLE | November 30, 1994

Application of neural networks and knowledge-based systems for automatic identification of fault-indicating fringe patterns

Proc. SPIE. 2342, Interferometry '94: Photomechanics

KEYWORDS: Fringe analysis, Holograms, Image processing, Nondestructive evaluation, Wave plates, Neural networks, System identification, Image classification, Holographic interferometry, Neurons

PROCEEDINGS ARTICLE | November 15, 1994

Identification and integrity verification of final disposal casks

Proc. SPIE. 2248, Optical Measurements and Sensors for the Process Industries

KEYWORDS: Packaging, Sensors, Data storage, Image segmentation, X-rays, Inspection, Feature extraction, Optical inspection, Image classification, Binary data

SPIE Journal Paper | May 1, 1994

Analysis and removal of the systematic phase error in interferograms

Yu, Qifeng , Andresen, Klaus , Osten, Wolfgang , Jueptner, Werner

OE Vol. 33 Issue 05

KEYWORDS: Fringe analysis, Error analysis, Phase shift keying, Modulation, Algorithm development, Digital holography, Interferometry, Visibility, Moire patterns, Holography

PROCEEDINGS ARTICLE | March 11, 1994

Image processing system for monitoring of conveyor belt systems

Proc. SPIE. 2183, Machine Vision Applications in Industrial Inspection II

KEYWORDS: Imaging systems, Cameras, Image segmentation, Image processing, Computing systems, Image analysis, CCD cameras, Signal processing, Image classification, Prototyping

PROCEEDINGS ARTICLE | March 1, 1994

Determination of the absolute order of one component of the surface displacement due to the evaluation of two interferograms of the specimen recorded under different loads

Proc. SPIE. 2004, Interferometry VI: Applications

KEYWORDS: Superposition, Holograms, Holography, Defect detection, Interferometry, Heterodyning, Thermal effects, Differential equations, Holographic interferometry, Phase shifts

PROCEEDINGS ARTICLE | March 1, 1994

Knowledge-assisted evaluation of fringe patterns for automatic fault detection

Proc. SPIE. 2004, Interferometry VI: Applications

KEYWORDS: Eye, Fringe analysis, Holography, Data modeling, Image processing, Pattern recognition, Inspection, Interferometry, Image classification, Binary data

SPIE Conference Volume | March 1, 1994

Interferometry VI: Applications

PROCEEDINGS ARTICLE | September 27, 1993

Surface deformation, recorded by the holographic interferometry, used as an interface between the modeling and the experiment in the field of overlap adhesive bonds

Proc. SPIE. 1999, Adhesives Engineering

KEYWORDS: Beam splitters, Holograms, Holography, 3D image reconstruction, Interfaces, Nondestructive evaluation, Distortion, Holographic interferometry, Adhesives, Holographic testing

PROCEEDINGS ARTICLE | June 1, 1993

Industrial optical inspection

Proc. SPIE. 10268, Optical Inspection and Testing: A Critical Review

KEYWORDS: Safety, Inspection, Optical inspection

PROCEEDINGS ARTICLE | April 22, 1993

Novel in-process sensor for high-power laser profile measurement

Proc. SPIE. 1834, Laser Energy Distribution Profiles: Measurement and Applications

KEYWORDS: Thin films, Diffraction, Mirrors, Beam splitters, Sensors, Laser energy, High power lasers, Silicon films, Position sensors, Laser beam diagnostics

PROCEEDINGS ARTICLE | March 2, 1993

Investigation of improved image quality for IR holographic optical elements by means of hyperbolic wavefront formed by cylindrical lens into object beam

Proc. SPIE. 1732, Holographics International '92

KEYWORDS: Infrared imaging, Diffraction, Monochromatic aberrations, Holograms, Holographic optical elements, Holography, Lithium, Wavefronts, Image quality, Infrared radiation

SPIE Conference Volume | February 15, 1993

Interferometry: Applications

PROCEEDINGS ARTICLE | February 15, 1993

Measurement of the deformation of a pressure vessel above a weld point

Proc. SPIE. 1756, Interferometry: Applications

KEYWORDS: Holography, Interferometry, Finite element methods, Chemical elements, Holographic interferometry, Holographic testing, Environmental sensing, Temperature metrology, Phase shifts, Protactinium

PROCEEDINGS ARTICLE | February 5, 1993

Measurement of displacement vector fields based on high-precision phase measurement

Proc. SPIE. 1755, Interferometry: Techniques and Analysis

KEYWORDS: Holograms, Holography, Interferometers, Error analysis, Inspection, Interferometry, Data acquisition, Phase measurement, Holographic interferometry, Condition numbers

PROCEEDINGS ARTICLE | February 5, 1993

Optimization of setups by means of geometric functions

Proc. SPIE. 1755, Interferometry: Techniques and Analysis

KEYWORDS: Laser sources, Holograms, Holography, Interferometry, Nondestructive evaluation, Precision measurement, Laser interferometry, Holographic interferometry, Lead, Distributed interactive simulations

PROCEEDINGS ARTICLE | January 1, 1992

Fourier transform evaluation of interference patterns: demodulation and sign ambiguity

Proc. SPIE. 1553, Laser Interferometry IV: Computer-Aided Interferometry

KEYWORDS: Optical filters, Holography, Spatial frequencies, Speckle, Interferometry, Demodulation, Heterodyning, Laser interferometry, Phase measurement, Phase shifts

PROCEEDINGS ARTICLE | January 1, 1992

Investigation of the stress distribution in intact bonds by holographic interferometry and finite element method

Proc. SPIE. 1553, Laser Interferometry IV: Computer-Aided Interferometry

KEYWORDS: Mirrors, Holograms, Holography, 3D image reconstruction, Metals, Laser interferometry, Finite element methods, Holographic interferometry, Adhesives, Holographic testing

PROCEEDINGS ARTICLE | October 1, 1991

DSPI: a tool for analyzing thermal strain on ceramic and composite materials

Proc. SPIE. 1508, Industrial Applications of Holographic and Speckle Measuring Techniques

KEYWORDS: Carbon, Fringe analysis, Holography, Digital signal processing, Speckle, Image processing, Ceramics, Composites, Solids, Thermal effects

SPIE Conference Volume | October 1, 1991

Industrial Applications of Holographic and Speckle Measuring Techniques

PROCEEDINGS ARTICLE | October 1, 1991

Synthetic wavelength interferometry for the extension of the dynamic range

Proc. SPIE. 1508, Industrial Applications of Holographic and Speckle Measuring Techniques

KEYWORDS: Mirrors, Beam splitters, Phase shifting, Holograms, Holography, Speckle, Interferometry, Heterodyning, Phase measurement, Holographic interferometry

PROCEEDINGS ARTICLE | October 1, 1991

Determination of the adhesive load by holographic interferometry using the results of FEM calculations

Proc. SPIE. 1508, Industrial Applications of Holographic and Speckle Measuring Techniques

KEYWORDS: Holograms, Holography, 3D image reconstruction, Speckle, Metals, Finite element methods, Structural design, Holographic interferometry, Adhesives, Holographic testing

PROCEEDINGS ARTICLE | March 1, 1991

Investigation of fiber-reinforced-plastics-based components by means of holographic interferometry

Proc. SPIE. 1400, Optical Fabrication and Testing

KEYWORDS: Holograms, Holography, Interferometers, Skin, Interferometry, Nondestructive evaluation, Optical fabrication, Optical testing, Antennas, Holographic interferometry

SPIE Conference Volume | March 31, 1989

Holography Techniques and Applications

Showing 5 of 118 publications

Conference Committee Involvement (28)

Interferometry XVI: Techniques and Analysis

13 August 2012 | San Diego, California, United States

Interferometry XV: Techniques and Analysis

2 August 2010 | San Diego, California, United States

Interferometry XIV: Techniques and Analysis

11 August 2008 | San Diego, California, United States

Optical Measurement Systems for Industrial Inspection

18 June 2007 | Munich, Germany

Interferometry XIII: Applications

16 August 2006 | San Diego, California, United States

Showing 5 of 28 published special sections

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