Dr. Werner P. O. Jüptner
Professor & Director of BIAS at
SPIE Involvement:
Board of Directors | European Advisory Committee | Fellows Committee | Symposia Committee | Fellow status | Conference Program Committee | Symposium Chair | Conference Chair | Track Chair | Author | Editor
Publications (118)

PROCEEDINGS ARTICLE | May 27, 2011
Proc. SPIE. 8082, Optical Measurement Systems for Industrial Inspection VII
KEYWORDS: Wavelet transforms, Data compression, Defect detection, Wavelets, Inspection, Fourier transforms, Linear filtering, Optical testing, Spectral resolution, Spatial resolution

PROCEEDINGS ARTICLE | August 21, 2009
Proc. SPIE. 7405, Instrumentation, Metrology, and Standards for Nanomanufacturing III
KEYWORDS: Mirrors, Phase shifting, Reflection, Imaging systems, Interferometers, Cameras, Image processing, Silicon, Reflectivity, Phase measurement

PROCEEDINGS ARTICLE | August 14, 2006
Proc. SPIE. 6292, Interferometry XIII: Techniques and Analysis
KEYWORDS: Optical components, Refractive index, Beam splitters, Interferometers, Sensors, Interferometry, Wavefronts, CCD cameras, Charge-coupled devices, Temperature metrology

PROCEEDINGS ARTICLE | March 7, 2006
Proc. SPIE. 4101, Laser Interferometry X: Techniques and Analysis
KEYWORDS: Sensors, Image segmentation, Ceramics, Inspection, Image resolution, Feature extraction, Image sensors, Fractal analysis, Shape analysis, Tolerancing

PROCEEDINGS ARTICLE | March 7, 2006
Proc. SPIE. 4101, Laser Interferometry X: Techniques and Analysis
KEYWORDS: Diffraction, Holograms, Holography, 3D image reconstruction, Digital holography, Particles, CCD cameras, Optical resolution, Optical simulations, Phase measurement

PROCEEDINGS ARTICLE | March 7, 2006
Proc. SPIE. 4101, Laser Interferometry X: Techniques and Analysis
KEYWORDS: Mirrors, Interferometers, Interferometry, Nondestructive evaluation, Optical testing, Semiconductor lasers, Head, Optoelectronics, Shearography, Michelson interferometers

Showing 5 of 118 publications
Conference Committee Involvement (28)
Interferometry XVI: Techniques and Analysis
13 August 2012 | San Diego, California, United States
Interferometry XV: Techniques and Analysis
2 August 2010 | San Diego, California, United States
Interferometry XIV: Techniques and Analysis
11 August 2008 | San Diego, California, United States
Optical Measurement Systems for Industrial Inspection
18 June 2007 | Munich, Germany
Interferometry XIII: Applications
16 August 2006 | San Diego, California, United States
Showing 5 of 28 published special sections
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