Wiebke Ehrig
at Physikalisch-Technische Bundesanstalt
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 19 January 2009
Proc. SPIE. 7239, Three-Dimensional Imaging Metrology
KEYWORDS: Metrology, Optical sensors, Optical spheres, Scattering, Interferometers, Sensors, Calibration, Light scattering, Optical testing, Standards development

Proceedings Article | 12 January 2009
Proc. SPIE. 7133, Fifth International Symposium on Instrumentation Science and Technology

Proceedings Article | 18 June 2007
Proc. SPIE. 6616, Optical Measurement Systems for Industrial Inspection V
KEYWORDS: Metrology, Optical sensors, Scattering, Sensors, Calibration, Light scattering, Manufacturing, Optical testing, Microsensors, Standards development

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