Wiktor A. Krajnik
at Warsaw Univ of Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 18 April 2021 Presentation + Paper
Proceedings Volume 11774, 117740R (2021) https://doi.org/10.1117/12.2589309
KEYWORDS: Fringe analysis, Amplitude modulation, Convolutional neural networks, Optical testing, Neural networks, Algorithm development, Spatial frequencies, Phase shift keying, Phase retrieval, Metrology

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