Dr. Wim A. de Groot
at Qualcomm Inc
SPIE Involvement:
Conference Chair | Author
Publications (5)

PROCEEDINGS ARTICLE | January 24, 2004
Proc. SPIE. 5348, MOEMS Display and Imaging Systems II
KEYWORDS: Oscillators, Switching, Modulation, Imaging systems, Silicon, Modulators, Microopto electromechanical systems, Aluminum, Analog electronics, Grating light valves

SPIE Conference Volume | December 9, 1999

PROCEEDINGS ARTICLE | January 22, 1999
Proc. SPIE. 3535, Advanced Sensors and Monitors for Process Industries and the Environment
KEYWORDS: Carbon, Methane, Sensors, Molecules, Nitrogen, Heat treatments, Oxygen, Raman spectroscopy, Carbon monoxide, Atmospheric monitoring

PROCEEDINGS ARTICLE | May 24, 1993
Proc. SPIE. 1862, Laser Applications in Combustion and Combustion Diagnostics
KEYWORDS: Rockets, Scattering, Molecules, Light scattering, Laser scattering, Oxygen, Raman spectroscopy, Rayleigh scattering, Raman scattering, Temperature metrology

Conference Committee Involvement (2)
Optical On-Line Industrial Process Monitoring
22 September 1999 | Boston, MA, United States
Advanced Sensors and Monitors for Process Industries and the Environment
4 November 1998 | Boston, MA, United States
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