William Ching
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 17 March 2015 Paper
W. Ching, J. Robinson, M. McEntee
Proceedings Volume 9416, 94161J (2015) https://doi.org/10.1117/12.2081738
KEYWORDS: Radiography, Sensors, X-rays, Calibration, Image quality, Image processing, Image sensors, Absorbance, X-ray detectors, Signal to noise ratio

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