Dr. William A. Christens-Barry
Chief Scientist at Equipoise Imaging LLC
SPIE Involvement:
Author
Publications (12)

Proceedings Article | 14 September 2011 Paper
Proceedings Volume 8133, 81330I (2011) https://doi.org/10.1117/12.893969
KEYWORDS: Statistical analysis, Calibration, Clouds, Interfaces, Laser scanners, Image processing, Computing systems, Imaging systems, Optical testing, Human-machine interfaces

Proceedings Article | 8 March 2011 Paper
Proceedings Volume 7869, 786909 (2011) https://doi.org/10.1117/12.877135
KEYWORDS: Principal component analysis, Image processing, Ultraviolet radiation, Light emitting diodes, Visible radiation, Multispectral imaging, Imaging systems, Near infrared, Iron, Visualization

Proceedings Article | 8 September 2010 Paper
Proceedings Volume 7799, 77990N (2010) https://doi.org/10.1117/12.860556
KEYWORDS: Error analysis, Clouds, Statistical analysis, Calibration, Laser scanners, Interfaces, Image processing, Data acquisition, Measurement devices, Data fusion

Proceedings Article | 16 February 2010 Paper
Fenella France, William Christens-Barry, Michael Toth, Kenneth Boydston
Proceedings Volume 7531, 75310E (2010) https://doi.org/10.1117/12.839000
KEYWORDS: Analytical research, Imaging systems, Image processing, Cultural heritage, Image analysis, Image enhancement, Imaging spectroscopy, Nondestructive evaluation, Visible radiation, Hyperspectral imaging

Proceedings Article | 16 February 2010 Paper
Roger Easton, Keith Knox, William Christens-Barry, Kenneth Boydston, Michael Toth, Doug Emery, William Noel
Proceedings Volume 7531, 75310D (2010) https://doi.org/10.1117/12.839116
KEYWORDS: Image processing, Imaging systems, Ultraviolet radiation, Imaging spectroscopy, Sensors, Luminescence, Principal component analysis, Visible radiation, Standards development, Light emitting diodes

Showing 5 of 12 publications
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