Dr. William A. Christens-Barry
Chief Scientist at Equipoise Imaging LLC
SPIE Involvement:
Author
Publications (12)

Proceedings Article | 14 September 2011
Proc. SPIE. 8133, Dimensional Optical Metrology and Inspection for Practical Applications
KEYWORDS: Human-machine interfaces, Statistical analysis, Imaging systems, Calibration, Image processing, Interfaces, Computing systems, Clouds, Optical testing, Laser scanners

Proceedings Article | 8 March 2011
Proc. SPIE. 7869, Computer Vision and Image Analysis of Art II
KEYWORDS: Near infrared, Visible radiation, Light emitting diodes, Principal component analysis, Iron, Visualization, Imaging systems, Image processing, Ultraviolet radiation, Multispectral imaging

Proceedings Article | 8 September 2010
Proc. SPIE. 7799, Mathematics of Data/Image Coding, Compression, and Encryption with Applications XII
KEYWORDS: Statistical analysis, Calibration, Image processing, Error analysis, Interfaces, Clouds, Data acquisition, Laser scanners, Measurement devices, Data fusion

Proceedings Article | 16 February 2010
Proc. SPIE. 7531, Computer Vision and Image Analysis of Art
KEYWORDS: Visible radiation, Light emitting diodes, Principal component analysis, Imaging systems, Sensors, Image processing, Ultraviolet radiation, Luminescence, Imaging spectroscopy, Standards development

Proceedings Article | 16 February 2010
Proc. SPIE. 7531, Computer Vision and Image Analysis of Art
KEYWORDS: Hyperspectral imaging, Visible radiation, Imaging systems, Image processing, Nondestructive evaluation, Imaging spectroscopy, Image analysis, Cultural heritage, Image enhancement, Analytical research

Showing 5 of 12 publications
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