Mr. William F. Leven
at Georgia Institute of Tech
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | May 19, 2005
Proc. SPIE. 5810, Acquisition, Tracking, and Pointing XIX
KEYWORDS: Detection and tracking algorithms, Particles, Error analysis, Particle filters, Software development, Electronic filtering, Algorithm development, Nonlinear filtering, Filtering (signal processing), Samarium

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