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William Lohry
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Publications (3)
SPIE Journal Paper | 2 November 2012 Open Access
Fourier transform profilometry using a binary area modulation technique
OE, Vol. 51, Issue 11, 113602, (November 2012) https://doi.org/10.1117/12.10.1117/1.OE.51.11.113602
KEYWORDS: Binary data, Modulation, Fourier transforms, Projection systems, Fringe analysis, 3D metrology, Error analysis, Digital Light Processing, Optical engineering, 3D image processing
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Proceedings Article | 13 September 2012 Paper
Improve Fourier transform profilometry by locally area modulating squared binary structured pattern
Proceedings Volume 8493, 849312 (2012) https://doi.org/10.1117/12.927439
KEYWORDS: Binary data, Modulation, 3D metrology, Fringe analysis, Fourier transforms, Projection systems, Gaussian filters, Quality measurement, Solids, Cameras
Proceedings Article | 10 September 2009 Paper
Optimal checkerboard selection for structured light system calibration
Proceedings Volume 7432, 743202 (2009) https://doi.org/10.1117/12.823829
KEYWORDS: Calibration, Projection systems, Cameras, Imaging systems, Phase shifts, 3D metrology, Distortion, Corner detection, Phase shifting, Structured light
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